Abstract:
In mass spectrometry, the number of ionized sample molecules affects various performance specifications of the resulting spectrum, including resolution, sensitivity, dynamic range, and scan speed. A voltage-controlled lens is used to control the number of electrons emitted from an electron source that enter the ion trap and ionize the target sample molecules. By monitoring a feature of the resulting spectrum, such as the resolution, total ion current, or a combination of these features, the lens voltage may be adjusted to create the optimal number of ions in the trap for a particular sample spectrum scan. Generally, for low concentration samples, the number of electrons introduced to the trap is increased, hence creating more ions in the trap, which in turn increases the intensity of the output signal improving the probability of detecting a sufficient number of ions by raising the intensity well above the noise floor. For higher concentration samples, the number of electrons is reduced, thus reducing interactions in the trap which in turn reduces peak broadening and improves resolution, as well as avoids saturating the detector. Several methods for adjusting the lens voltage may be used. First, the lens voltage may be repeatedly adjusted until the resulting spectrum reaches a desired trade-off between resolution and sensitivity. The lens voltage may also be incrementally increased until the resulting spectrum begins to exhibit space charge effects. Finally, all lens voltages in a list of usable voltage settings may be applied, and all the resulting spectra are compared. The optimal voltage setting is selected and used for subsequent scans.
Abstract:
A mass spectrometer for analyzing a sample utilizing an ion trap comprises an entrance end cap defining an entrance aperture configured to receive the sample entering the ion trap; a ring electrode defining a ring cavity configured to generate, based on a radio frequency (RF) voltage applied to the ring electrode, an electric field configured to trap the sample received through the entrance aperture; an exit end cap defining an exit aperture configured to receive sample ions exiting the ion trap; and an end cap controller configured to generate a bias control voltage for applying a DC bias potential to at least one of the entrance end or the exit end cap, wherein a value of the bias control voltage is based on an operational parameter of the mass spectrometer.
Abstract:
A mass spectrometer comprises an ion trap configured to trap ions and to eject ions. The ion trap comprises an e!ectrode. The mass spectrometer further comprises a detector configured to detect ions ejected from the ion trap, a radio frequency (RF) generator electrically coupled to the electrode and configured to generate an RF signal, a sampling circuit electrically coupled to electrode and configured to measure a voltage of the RF signal at the electrode, and a signal processor electrically coupled to the sampling circuit and the detector. The signal processor is configured to receive outputs from the detector and the sampling circuit and to correct the output from the detector based on the output from the sampling circuit.
Abstract:
An ion trap for a mass spectrometer is disclosed. The ion trap includes a ring electrode and first and second electrodes which are arranged on opposite sides of the ring electrode. The ring electrode and the first and second electrodes are configured to generate an electric field based on the received RF signal. The first electrode defines a first aperture and the second electrode defines a second aperture, the first aperture and the second aperture being asymmetric relative to each other and configured to generate a hexapoie field.
Abstract:
A mass spectrometer system is disclosed. The mass spectrometer includes a vacuum chamber defining an enclosed evacuated space and an ion trap disposed in the enclosed space. The ion trap is configured to trap an ionized sample. The mass spectrometer further includes an son detector coupled to the chamber at a location external to the chamber such that sample ions may exit the evacuated space and into the externally-coupled detector without loss of vacuum pressure.
Abstract:
An ion trap for a mass spectrometer is disclosed. The ion trap includes a ring electrode and first and second electrodes which are arranged on opposite sides of the ring electrode. The ring electrode and the first and second electrodes are configured to generate an electric field based on the received RF signal. The first electrode defines a first aperture and the second electrode defines a second aperture, the first aperture and the second aperture being asymmetric relative to each other and configured to generate a hexapole field.
Abstract:
Apparatuses and methods for performing mass analysis are disclosed. One such apparatus may include an ion trap device. The ion trap device may comprise a first end cap having a first aperture and a second end cap having a second aperture, wherein the first aperture and the second aperture may define an ejection axis. The ion trap device may also comprise a ring electrode substantially coaxially aligned between the first and second end caps. The ring electrode may include an opening extending along a radial direction of the ring electrode, wherein the radial direction is substantially perpendicular to the ejection axis. One such method may include ionizing a sample in an ion trap through an opening separating at least part of first and second ring sections of the ion trap and detecting ions ejected though an aperture on an end cap of the ion trap.
Abstract:
A mass spectrometer comprising a controller configured to generate an RF signal to be applied to an electrode during the mass scan, wherein the electrode generates, based on the RF signal, an electric field to be applied to sample ions during a mass scan; an ion detector configured to detect sample ions passing through the electric field and generate a corresponding ion detection signal; and a sampling circuit configured to sample the ion detection signal; wherein the controller is configured to adjust a phase of the at least one RF signal relative to a sample timing of the sampling circuit and average successive mass scans to cancel a portion of the RF signal present in the ion detection signal.
Abstract:
Apparatuses, systems, and methods for performing mass analysis are disclosed. One such apparatus may include an ion trap device for use in a mass analysis system. The ion trap device may comprise a ring electrode, a pair of endcaps, and a signal generator for applying a trapping signal to the ring electrode. The trapping signal may be configured to cause the ring electrode to generate an electric field. The signal generator may include a plurality of oscillators each configured to selectively generate a corresponding sinusoid signal to be selectively combined to form the trapping signal.