BEAM PROFILE MEASURING DEVICE AND METHOD THEREFOR

    公开(公告)号:JP2002316364A

    公开(公告)日:2002-10-29

    申请号:JP2002015983

    申请日:2002-01-24

    Abstract: PROBLEM TO BE SOLVED: To provide a device for measuring the overall intensity and power of a beam by measuring the intensity profile of the beam, with regard to an optical three-dimensional shaping process. SOLUTION: In a sensor for beam profile measurement equipped with a pinhole plate and an optical detector arranged behind the former, a beam spot is transferred and consequently, the sensor for beam profile measurement measures an intensity which is respectively covered by some of different regions inside the beam spot. Software interrelated with the sensor for beam profile measurement controls a beam scan mechanism in a computer to transfer the beam spot onto a pinhole. Further, the software controls the mechanism to make the beam spot traverse over the pinhole and thus the intensity profile of the beam is obtained. A related device and a related method for the calibration and standardization of a three-dimensional shaping device are disclosed. In addition, a related device and a related method for correcting a positional deviation over time in the process of shaping a three-dimensional object are revealed.

    STEREOLITHOGRAPHIC BEAM PROFILING

    公开(公告)号:CA1334052C

    公开(公告)日:1995-01-24

    申请号:CA596826

    申请日:1989-04-17

    Applicant: 3D SYSTEMS INC

    Abstract: An apparatus and a method for profiling the intensity of a beam and thus measuring the overall intensity and power of a beam are disclosed that have particular use in stereolithography. A beam sensor comprising a pinhole in a plate and a photodetector behind the pinhole measures the intensity of portions of a beam as the beam is moved over the beam sensor. Software associated with the sensors in a computer controls the scanning mechanism for the beam so that the beam is shifted to find the pinhole and move across it in order to develop the intensity profile. The invention can be used to detect drift in the scanning mechanism, determine the focus of the beam, and predict the depth and width of photopolymer cured by the beam. A related apparatus and method for calibrating and normalizing a stereolithographic apparatus is described, and a related apparatus and method for correcting for drift in production of objects by stereolithography, is also described.

    STEREOLITHOGRAPHIC CURL REDUCTION

    公开(公告)号:CA1339750C

    公开(公告)日:1998-03-17

    申请号:CA596827

    申请日:1989-04-17

    Applicant: 3D SYSTEMS INC

    Abstract: 94 An improved stereolithography system for generating a three-dimensional object by creating a cross-sectional pattern of the object to be formed at a selected surface of a fluid medium capable of altering its physical state in response to appropriate synergistic stimulation by impinging radiation, particle bombardment or chemical reaction, information defining the object being structurally specified to reduce curl, stress and distortion in the ultimately formed object, the successive adjacent laminae, representing corresponding successive adjacent cross-sections of the object, being automatically formed and integrated together to provide a step-wise laminar buildup of the desired object, whereby a three-dimensional object is formed and drawn from a substantially planar surface of the fluid medium during the forming process. A stereolithographic distortion known as curl is defined, and several techniques to eliminate or reduce curl are described, including dashed line, bent line, secondary structure, rivets, and multi-pass techniques. In addition, a quantitative measurement of curl known as the curl factor, and a test part known as a quarter cylinder are described, which together can be used to measure the effectiveness of the above techniques in reducing curl.

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