MEASURING APPARATUS, SYSTEM, AND PROGRAM
    4.
    发明申请
    MEASURING APPARATUS, SYSTEM, AND PROGRAM 审中-公开
    测量装置,系统和程序

    公开(公告)号:US20160321825A1

    公开(公告)日:2016-11-03

    申请号:US15106219

    申请日:2014-12-23

    Abstract: To provide an apparatus, a system, and a program that can easily detect an image region where retroreflected light is recorded without being influenced by a neighboring object. In one embodiment, a measuring apparatus (1) includes an imaging unit (11), a converter (141) that converts first image data captured by the imaging unit using light emission for photography and second image data captured by the imaging unit without using the light emission for photography to luminance values, a differential processor (142) that calculates a difference between a first luminance value based on the first image data and a second luminance value based on the second image data for each pixel and generates an output image visually representing a region where the difference is present based on an obtained differential image, and a display unit (16) that displays the output image.

    Abstract translation: 提供一种可以容易地检测记录回射光的图像区域而不受邻近对象的影响的装置,系统和程序。 在一个实施例中,测量装置(1)包括成像单元(11),转换器(141),其使用用于摄影的发光和由成像单元拍摄的第二图像数据来转换由成像单元捕获的第一图像数据,而不使用 用于摄影的亮度发光到亮度值;差分处理器(142),其基于第一图像数据计算第一亮度值与基于每个像素的第二图像数据的第二亮度值之间的差异,并生成视觉上表示的输出图像 基于获得的差分图像存在差异的区域,以及显示输出图像的显示单元(16)。

    THREE-DIMENSIONAL(3D) TEST STANDARD
    8.
    发明申请

    公开(公告)号:US20180003491A1

    公开(公告)日:2018-01-04

    申请号:US15538311

    申请日:2015-12-18

    CPC classification number: G01B21/042 G01B3/30 G01B21/20

    Abstract: Three-dimensional test objects provide for assessment of a 3D scanner over a range of scales, frequencies, and/or depths. The test objects may include a substrate having a substantially planar top surface and a plurality of surface features. In some examples, the surface features include a plurality of wedges projecting above the plane of the top surface and extending radially outward from an origin to form a three dimensional star pattern. The shape of the surface features may be periodic or non-periodic. In other examples, the depth of the surface features is decoupled from their lateral frequency.

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