中科微点-全球专利检索

  1. Login
  2. Sign Up

Search Results

8 records (took 0.026 seconds)

    EVENT DETECTION IN TEMPORARY TRAFFIC CONTROL ZONES
    3.
    发明申请
    EVENT DETECTION IN TEMPORARY TRAFFIC CONTROL ZONES 审中-公开

    公开(公告)号：WO2019191412A1

    公开(公告)日：2019-10-03

    申请号：PCT/US2019/024559

    申请日：2019-03-28

    Applicant: 3M INNOVATIVE PROPERTIES COMPANY

    Inventor： JOHNSON, Justin M. ,  HOWARD, James W. ,  FALKNOR, Subhalakshmi M.

    IPC: F16P3/14 ,  E01F9/30 ,  E01F9/688 ,  E01F9/604 ,  G08G1/0955 ,  G08B5/00 ,  E01F9/654

    Abstract: In some examples, a computing device may store a temporary traffic control zone compliance set (TTCZCS) comprising a set of indications of traffic control features for a temporary traffic control zone, wherein the set of indications of traffic control features represent that the temporary traffic control zone is compliant with at least one criterion; receive a set of indications of infrastructure articles from a set of sensors that detect the infrastructure articles in the traffic control zone; detect non-compliance of the at least one criterion based on an indication at least one infrastructure article in the temporary traffic control zone and at least one indication of a traffic control feature that corresponds to the infrastructure article; and perform at least one operation based on detection of the non-compliance of the at least one criterion for the temporary traffic control zone.

    VERIFYING STRUCTURAL INTEGRITY OF MATERIALS USING REFERENCE IMPEDANCE
    4.
    发明申请
    VERIFYING STRUCTURAL INTEGRITY OF MATERIALS USING REFERENCE IMPEDANCE 审中-公开

    公开(公告)号：WO2018112311A1

    公开(公告)日：2018-06-21

    申请号：PCT/US2017/066606

    申请日：2017-12-15

    Applicant: 3M INNOVATIVE PROPERTIES COMPANY

    Inventor： YUUNGERS, Christopher R. ,  FALKNOR, Subhalakshmi M. ,  REDINGER, David H.

    IPC: G01N27/20 ,  G01N27/24

    Abstract: A measurement system may include a set of drive electrical contacts including a force electrical contact and a return electrical contact electrically coupled to a tested material, a measurement electrical contact electrically coupled to the tested material, a return node, a voltage source, and a control module. A circuit path between the voltage source and the return node may include a fixed resistor and the tested material. The control module may be configured to cause the voltage source to apply a voltage signal to the force electrical contact, cause a voltage drop across the fixed resistor to be measured, cause a measured voltage to be measured using the measurement electrical contact, determine a measured equivalent impedance of the tested material associated with the measurement electrical contact based on the voltage drop across the fixed resistor and the measured voltage, and determine whether the tested material includes a crack or other defect based on the measured equivalent impedance.

Patent Agency Ranking