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1.发明申请AN INFRARED MEASURING APPARATUS AND METHOD FOR ON-LINE APPLICATION IN MANUFACTURING PROCESSES 审中-公开用于制造过程中的在线应用的红外测量装置和方法
公开(公告)号：WO2004031752A2
公开(公告)日：2004-04-15
申请号：PCT/US2003/031142
申请日：2003-10-02
Applicant: ABB INC.
Inventor： BURK, Gary, Neil , DOMIN, Thomas, Michael , MAXSON, Rodney, Dale , DAUGHERTY, Dennis, Charles , STURM, Steven, Perry
IPC: G01N21/86
CPC classification number: G01N21/86 , G01N21/3563 , G01N33/346 , G01N2021/8917 , G02B26/04
Abstract: A single vane (46, 48) shutter flag (38) is asynchronously controlled (82) so that a measuring system light source (22) is interrupted for a minimum necessary amount of time for standardization/calibration and normalization of InGaAs system detectors (68a - 68d). Source/detector hemispheres (50, 62) or serially connected randomly oriented fiber bundles (132) homogenize light passing to the detectors. Light source testing is performed by measuring spectral power distributions at a plurality of light source power levels and comparing the measurements to baseline characteristics established for the light source. Calibration sample life is extended indefinitely by controlling the shutter flag to block source light except for short calibration time periods during which standard light levels are provided.
Abstract translation: 单个叶片（46,48）快门标志（38）被异步地控制（82），使得测量系统光源（22）被中断至少必需的时间量，用于InGaAs系统检测器（68a）的标准化/校准和归一化 - 68d）。 源/检测器半球（50,62）或串联连接的随机取向纤维束（132）使通过检测器的光均匀化。 通过测量多个光源功率电平上的光谱功率分布并将测量值与为光源建立的基线特性进行比较来执行光源测试。 通过控制快门标志来阻止源光，校准采样寿命无限期，除了提供标准光级的短校准时间段外。
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2.发明公开
公开(公告)号：EP1546690A2
公开(公告)日：2005-06-29
申请号：EP03759646.7
申请日：2003-10-02
Applicant: ABB Inc.
Inventor： BURK, Gary, Neil , DOMIN, Thomas, Michael , MAXSON, Rodney, Dale , DAUGHERTY, Dennis, Charles , STURM, Steven, Perry
CPC classification number: G01N21/86 , G01N21/3563 , G01N33/346 , G01N2021/8917 , G02B26/04
Abstract: A single vane (46, 48) shutter flag (38) is asynchronously controlled (82) so that a measuring system light source (22) is interrupted for a minimum necessary amount of time for standardization/calibration and normalization of InGaAs system detectors (68a - 68d). Source/detector hemispheres (50, 62) or serially connected randomly oriented fiber bundles (132) homogenize light passing to the detectors. Light source testing is performed by measuring spectral power distributions at a plurality of light source power levels and comparing the measurements to baseline characteristics established for the light source. Calibration sample life is extended indefinitely by controlling the shutter flag to block source light except for short calibration time periods during which standard light levels are provided.
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3.发明授权
公开(公告)号：EP1546690B1
公开(公告)日：2010-03-10
申请号：EP03759646.7
申请日：2003-10-02
Applicant: ABB Inc.
Inventor： BURK, Gary, Neil , DOMIN, Thomas, Michael , MAXSON, Rodney, Dale , DAUGHERTY, Dennis, Charles , STURM, Steven, Perry
CPC classification number: G01N21/86 , G01N21/3563 , G01N33/346 , G01N2021/8917 , G02B26/04
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