公开(公告)号：FI924319A0

公开(公告)日：1992-09-25

申请号：FI924319

申请日：1992-09-25

Applicant: ABB PROCESS AUTOMATION INC

Inventor： BURK GARY N

IPC: G01J3/46 ,  G01N21/86 ,  G01N

Abstract: The stack reflectance is predicted from an on-line, wavelength dependent measurement of the sheet reflectance and the on-line measurement of the sheet opacity at a wavelength interval. The stack reflectance Rst is then used to predict and/or control stack color, preferably by using the parameter K/S=(1-Rst2)/2 Rst where K is the dye absorption coefficient and S is the dye scattering coefficient.

公开(公告)号：FI110818B

公开(公告)日：2003-03-31

申请号：FI924319

申请日：1992-09-25

Applicant: ABB PROCESS AUTOMATION INC

Inventor： BURK GARY N

IPC: G01J3/46 ,  G01N21/86

Abstract: The stack reflectance is predicted from an on-line, wavelength dependent measurement of the sheet reflectance and the on-line measurement of the sheet opacity at a wavelength interval. The stack reflectance Rst is then used to predict and/or control stack color, preferably by using the parameter K/S=(1-Rst2)/2 Rst where K is the dye absorption coefficient and S is the dye scattering coefficient.

公开(公告)号：CA2038103C

公开(公告)日：1996-08-13

申请号：CA2038103

申请日：1991-03-12

Applicant: ABB PROCESS AUTOMATION INC

Inventor： BURK GARY N

IPC: G01J3/46 ,  G01N21/86 ,  G05D25/02

Abstract: The stack reflectance is predicted from an on-line, wavelength dependent measurement of the sheet reflectance and the on-line measurement of the sheet opacity at a wavelength interval. The stack reflectance Rst is then used to predict and/or control stack color, preferably by using the parameter K/S = (1-Rst

公开(公告)号：FI924319A

公开(公告)日：1992-09-25

申请号：FI924319

申请日：1992-09-25

Applicant: ABB PROCESS AUTOMATION INC

Inventor： BURK GARY N

IPC: G01J3/46 ,  G01N21/86

Abstract: The stack reflectance is predicted from an on-line, wavelength dependent measurement of the sheet reflectance and the on-line measurement of the sheet opacity at a wavelength interval. The stack reflectance Rst is then used to predict and/or control stack color, preferably by using the parameter K/S=(1-Rst2)/2 Rst where K is the dye absorption coefficient and S is the dye scattering coefficient.

公开(公告)号：CA2038103A1

公开(公告)日：1991-09-28

申请号：CA2038103

申请日：1991-03-12

Applicant: ABB PROCESS AUTOMATION INC

Inventor： BURK GARY N

IPC: G01J3/46 ,  G01N21/86 ,  G05D25/02

Abstract: The stack reflectance is predicted from an on-line, wavelength dependent measurement of the sheet reflectance and the on-line measurement of the sheet opacity at a wavelength interval. The stack reflectance Rst is then used to predict and/or control stack color, preferably by using the parameter K/S=(1-Rst2)/2 Rst where K is the dye absorption coefficient and S is the dye scattering coefficient.