公开(公告)号：US11953477B2

公开(公告)日：2024-04-09

申请号：US17271620

申请日：2019-08-20

Applicant: ABB Schweiz AG

Inventor： Jinendra Gugaliya ,  Arun Kumar Gupta

IPC: G01N30/86 ,  G05B13/02 ,  G01N30/02

CPC classification number: G01N30/8624 ,  G05B13/0265 ,  G01N2030/025

Abstract: The present application discloses method and sewer (111) for detecting faults associated with a gas chromatograph device (100) in a process plant. The gas chromatograph device (100) is associated with a database (110) configured to store a measured chromatogram, and historic chromatograms. Initially, the server receives the measured chromatogram from the database. Upon receiving the measured chromatogram, the server is configured to detect at least one real-time symptom for measured chromatogram. The real-time symptoms may be detected by comparing the historic chromatograms with predetermined configuration data to the measured chromatogram. Upon detecting the real-time symptoms, the server is configured to determine faults associated with the gas chromatograph device. The faults are determined by mapping the real-time symptoms and fault signature data received from the database. The fault signature data is generated using machine learning model trained by providing the faults and the historic gas chromatogram.