公开(公告)号：US10263507B2

公开(公告)日：2019-04-16

申请号：US15740139

申请日：2016-05-10

Applicant: ABB Schweiz AG

Inventor： Hariram Satheesh ,  Mallikarjun Kande ,  Rahul Gore ,  Simi Valsan

IPC: H02M1/40 ,  G01R15/18 ,  G01R19/20 ,  G01R35/00 ,  G05F3/02

Abstract: A method for generating corrected measured current in an Intelligent Electronic Device (IED) that is a true representation of primary current in an electrical network is disclosed. The method uses regression and a first threshold on measured sampled values from CT to detect a deviation instance that indicates a possibility of saturation. Wavelet and second threshold based detection of instances of saturation is then done. Then a regression based correction that uses a dynamic correction factor is implemented in real time to obtain corrected sampled values i.e. corrected measured current. Ending of correction is done based upon a predetermined selection criterion, The generated corrected measured current is used for protection and control functions in the IED. A CT output re-generation module as a functional module in the IED for implementing the method as described above is also disclosed.