公开(公告)号：JP2002156396A

公开(公告)日：2002-05-31

申请号：JP2000355637

申请日：2000-11-17

Applicant: ADVANTEST CORP

Inventor： UJIIE HITOSHI ,  KONNO SHIGETOSHI ,  YOSHINO YUJI

IPC: G04G3/00 ,  G01R23/02 ,  G01R23/10 ,  G01R23/12 ,  G01R23/15 ,  G01R23/173 ,  G01R35/00 ,  G01S19/14 ,  G04C9/04 ,  G04F10/04 ,  G04R20/00 ,  G01S5/14 ,  G04G7/02

Abstract: PROBLEM TO BE SOLVED: To provide a time/frequency measuring device, capable of carrying out measurement by automatically determining whether a high-precision frequency signal fout generated by a reference frequency generating device is in a applicable state at a measuring side of a time/frequency measuring device, based on frequency accuracy information from the reference frequency generating device. SOLUTION: The time/frequency measuring device detects that frequency deviation information of the high-precision frequency signal outputted by an outside reference oscillator is within a prescribed frequency deviation as a target, and carries out measurement of a frequency or time of a signal to be measured by applying the high-precision frequency signal, based on the detection.