公开(公告)号：DE19750349C2

公开(公告)日：2000-05-18

申请号：DE19750349

申请日：1997-11-13

Applicant: ADVANTEST CORP

Inventor： NAGANO MASAO ,  KOTANI NORIHITO

IPC: E06B9/24 ,  B60J1/00 ,  B60J3/06 ,  C03C17/34 ,  G01R27/28 ,  G01R23/16

公开(公告)号：DE19750349A1

公开(公告)日：1998-05-28

申请号：DE19750349

申请日：1997-11-13

Applicant: ADVANTEST CORP

Inventor： NAGANO MASAO ,  KOTANI NORIHITO

IPC: E06B9/24 ,  B60J1/00 ,  B60J3/06 ,  C03C17/34 ,  G01R27/28 ,  G01R23/16

Abstract: The analyser (1) comprises a multiple sine wave signal generator (10) operating with a sample signal generator (11), D-A converters (12,13), deep pass filters (14,15) and a quadrature modulator (16) to produce a signal consisting of a synthesis of several sine waves of different frequencies within a chosen band. This signal is applied to the DUT i.e. component or equipment under test (3). The measuring signal then transmitted from the DUT to the analyser is changed to a digital value through an A-D converter (35), and fed into a signal processor (30) where it is conducted through a quadrature analysis section (36) and fast Fourier transformation (43) to the phase/amplitude comparator (44) for evaluation. The system ensures high accuracy of measurement in a very short time span.