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    1.
    发明专利
    未知

    公开(公告)号：DE60121596T2

    公开(公告)日：2007-07-05

    申请号：DE60121596

    申请日：2001-06-08

    Applicant: ADVANTEST CORP

    Inventor： KOIZUMI SATOSHI ,  NAKADA JUICHI ,  NISHINO EIJI ,  ICHIKAWA HIDEKI

    IPC: H04B1/707 ,  H04B17/00 ,  H04J11/00 ,  H04J13/10 ,  H04L1/24

    Abstract: Display regions W8, 4, 16, 32, 64, and 128 have widths corresponding to band widths which are determined by Walsh code lengths, and have heights which represents electric powers. Therefore, while electric powers of to-be-measured channels different in Walsh length are displayed in combination, it is possible to see a correlation between each display region and each Walsh length. Besides, since display regions are arranged in Paley order, there is no fear of overlap between display regions.

    MULTIPLEXED SIGNAL QUALITY DISPLAY, METHOD, AND PROGRAM, AND RECORDED MEDIUM WHERE THE PROGRAM IS RECORDED
    2.
    发明公开
    MULTIPLEXED SIGNAL QUALITY DISPLAY, METHOD, AND PROGRAM, AND RECORDED MEDIUM WHERE THE PROGRAM IS RECORDED 有权
    被复用的信号质量显示方法以及程序和记录介质在其上记录的程序

    公开(公告)号：EP1304823A1

    公开(公告)日：2003-04-23

    申请号：EP01936914

    申请日：2001-06-08

    Applicant: ADVANTEST CORP

    Inventor： KOIZUMI SATOSHI ,  NAKADA JUICHI ,  NISHINO EIJI ,  ICHIKAWA HIDEKI

    IPC: H04B1/707 ,  H04B17/00 ,  H04J11/00 ,  H04J13/10 ,  H04L1/24 ,  H04J13/04

    CPC classification number: H04L1/24 ,  H04B17/23 ,  H04B17/327 ,  H04J13/10

    Abstract: Display regions W8, 4, 16, 32, 64, and 128 have widths corresponding to band widths which are determined by Walsh code lengths, and have heights which represents electric powers. Therefore, while electric powers of to-be-measured channels different in Walsh length are displayed in combination, it is possible to see a correlation between each display region and each Walsh length. Besides, since display regions are arranged in Paley order, there is no fear of overlap between display regions.

    Abstract translation: 显示区域W8，4，16，32，64，和128具有宽度对应于带宽哪些是确定性由沃尔什码长度开采，和高度有哪些darstellt电功率。 因此，虽然对被测定在不同的沃尔什长度信道的电功率被显示在组合，可以看到每个显示区域，并且每个沃尔什长度之间的相关性。 此外，由于显示区域在佩利的秩序排列，所以不必担心显示区域之间的重叠。

    6.
    发明专利
    未知

    公开(公告)号：DE60123060T2

    公开(公告)日：2007-06-06

    申请号：DE60123060

    申请日：2001-06-08

    Applicant: ADVANTEST CORP

    Inventor： KOIZUMI SATOSHI ,  NAKADA JUICHI ,  NISHINO EIJI ,  ICHIKAWA HIDEKI

    IPC: H04B1/707 ,  H04B17/00 ,  H04J11/00 ,  H04J13/00 ,  H04L1/24

    Abstract: Since a multiplexed signal quality display system according to the present invention is provided with a memory means which stores measurement results obtained by measuring electric powers of signals present in all of channels within a band used and a display means which specifies a channel where the presence of a signal is predicted and which reads and displays the measured value of the specified channel, it is possible to display the waveform quality of a channel which is determined by desired Walsh code and Walsh code length.

    7.
    发明专利
    未知

    公开(公告)号：DE60123798D1

    公开(公告)日：2006-11-23

    申请号：DE60123798

    申请日：2001-06-08

    Applicant: ADVANTEST CORP

    Inventor： KOIZUMI SATOSHI ,  NAKADA JUICHI ,  ICHIKAWA HIDEKI ,  NISHINO EIJI

    IPC: H04B1/707 ,  H04B17/00 ,  H04J11/00 ,  H04L1/24

    Abstract: A signal power coefficient and a noise power coefficient are calculated for each channel, using parameters which have been optimized up to a small error value by an optimizing means, then using the thus calculated signal power coefficient and noise power coefficient, there are determined a signal power and a noise power for each channel, and the signal power and the noise power thus determined are displayed on one and same display screen channel by channel.

    8.
    发明专利
    未知

    公开(公告)号：DE10147337C2

    公开(公告)日：2003-11-27

    申请号：DE10147337

    申请日：2001-09-26

    Applicant: ADVANTEST CORP

    Inventor： NAKADA JUICHI

    IPC: H03M1/12 ,  H03M1/06 ,  H03M1/08

    Abstract: An input delay correcting system for an interleave type A/D converter is to be provided. Even if sampling clock signals fed to A/D converters 22 and 24 are not exactly shifted a half cycle from each other, a digital signal outputted from an output terminal 30d of an FIR filter 30 becomes a pulse of a tuning exactly shifted a half cycle from the sampling clock signal fed to the A/D converter 22. A digital signal outputted from, an output terminal 30c of the FIR filter 30 corresponds to a signal resulting from delaying an output of the A/D converter 22 by an integer multiple of the sampling clock signal cycle. Therefore, if the outputs from the output terminals 30c and 30d of the FIR filter 30 are made alternate by a multiplexer 40, the outputs of the A/D converters 22 and 24 can be exactly shifted a half cycle with respect to the sampling clock signals fed thereto.

    9.
    发明专利
    未知

    公开(公告)号：DE69736546T2

    公开(公告)日：2007-08-23

    申请号：DE69736546

    申请日：1997-12-09

    Applicant: ADVANTEST CORP

    Inventor： NAKADA JUICHI

    IPC: G01R29/08 ,  H04B1/707 ,  H04J13/00

    Abstract: The present invention offers a method and apparatus for measuring the waveform quality of a CDMA signal with increased accuracy. A baseband digital measuring signal Z(k) from a quadrature transform/complementary filter 22 is applied to a demodulating part 25, wherein it is demodulated by a PN code of a pilot signal to detect a bit train and an amplitude a'i. An ideal signal Ri is generated from the bit train, the amplitude a'i and the PN code. At the same time, auxiliary data A, B, C, H and I, which are used to solve approximate simultaneous equations for computing parameters that minimize the square of the difference between the ideal signal Ri and the measuring signal Z(k), are generated in an ideal signal/auxiliary data generating part 26. The thus obtained auxiliary data and the measuring signal Z(k) are used to solve the simultaneous equations to estimate the parameters in a parameter estimating part 27. The parameters are optimized by repeatedly correcting the measuring signal Z(k), the ideal signal Ri and the auxiliary data A, B, C, H, I based on the estimated parameters and estimating the parameters based on the corrected data. When the parameters are optimized, the power coefficient rho i is computed using the optimized measuring signal Z(k) and the PN code.

    10.
    发明专利
    未知

    公开(公告)号：DE112005000267T5

    公开(公告)日：2007-01-25

    申请号：DE112005000267

    申请日：2005-01-19

    Applicant: ADVANTEST CORP

    Inventor： KUROSAWA MAKOTO ,  NAKADA JUICHI

    IPC: G01R25/00 ,  G01R23/20 ,  G01R27/28

    Abstract: A phase measurement device measures an output of an amplifier when an input signal having input frequency components is fed to the amplifier, and includes multipliers for orthogonally transforming the output of the amplifier a phase acquisition section for acquiring phases theta1 and theta2 of the input frequency components in the output of the multipliers, and theta3 and theta4 (third distortion), and theta5 and theta6 (fifth distortion) of the distortion components, a match time/phase measurement section for measuring a match time point Deltat when theta1 and theta2 match each other and a distortion component phase measurement section for measuring phases theta3 to theta6 at the match time point Deltat. The phase acquisition section acquires at least one of theta1 and theta2, and theta3 and theta5 (with the frequencies higher than those of theta1 and theta2) or theta4 and theta6 (with the frequencies lower than those of theta1 and theta2).

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