METHOD AND DEVICE FOR DECOMPOSING CIRCUIT MEMBER BY WATER IN SUPERCRITICAL FLUID STATE
    1.
    发明公开
    METHOD AND DEVICE FOR DECOMPOSING CIRCUIT MEMBER BY WATER IN SUPERCRITICAL FLUID STATE 审中-公开
    方法和设备,通过使水在状态超临界流动性的一个电路元件切割

    公开(公告)号:EP1125647A4

    公开(公告)日:2002-11-27

    申请号:EP99970040

    申请日:1999-10-01

    Applicant: ADVANTEST CORP

    CPC classification number: B01D11/0203 B08B7/0021 B09B5/00

    Abstract: A supercritical fluid is formed by heating a liquid-state water (13) sealed along with a circuit member (30) into an airtight container (2) by an internal heating means (4) to heat the water (13) to not lower than a preset temperature and pressurize it to not lower than a preset pressure. A supercritical fluid, being extremely high in intermolecular collision rate, can deliver a specific dissolution power and activate various reactions favorably to thereby satisfactorily and quickly decompose a circuit member (30) which is difficult to be decomposed by a liquid- or gaseous-state water. In addition, an addition of sulfur (14) to a liquid-state water (13) can recover various metals from a circuit member (30) favorably.

    METHOD AND APPARATUS FOR TREATING MEMBER

    公开(公告)号:JP2000107725A

    公开(公告)日:2000-04-18

    申请号:JP28140098

    申请日:1998-10-02

    Applicant: ADVANTEST CORP

    Abstract: PROBLEM TO BE SOLVED: To decompose a circuit member without requiring a poison and a largescale apparatus to enable the recovery of various substances. SOLUTION: Water 13 and a circuit member 30 are sealed in a sealed container and heated by an internal heating means 4, the water 13 is heated at a prescribed temperature or above and pressurized at a prescribed pressure or above to prepare supercritical fluid. The supercritical fluid, in which the frequency of intermolecular collision is extremely high. demonstrates special dissolution power and can activate various reactions remarkably so that a circuit member 30 which can hardly be decomposed in water in the state of liquid or gas can be decomposed well and promptly.

    SUBSTRATE INSPECTING METHOD AND DEVICE THEREFOR

    公开(公告)号:JP2000028551A

    公开(公告)日:2000-01-28

    申请号:JP19148998

    申请日:1998-07-07

    Applicant: ADVANTEST CORP

    Abstract: PROBLEM TO BE SOLVED: To quickly inspect a surface of a substrate with a simple device. SOLUTION: A standard substrate 3 is faced symmetrically to a testing substrate 2 by a substrate arranging means 26 via an electrode member 4, then an RF electromagnetic wave is propagated to the member 4 by a network analyzer 5 to measure a characteristic, and the presence of defects in a surface of the testing substrate 2 is determined by a defective detecting means 25, based on a result measured hereinbefore. Since the surface condition of the substrate 2 is inspected based on a propagation characteristic of the RF electromagnetic wave, neither a device of large scale having complicated structure is not required nor long working time is not required.

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