PORTABLE PLASMA BASED DIAGNOSTIC APPARATUS AND DIAGNOSTIC METHOD
    1.
    发明申请
    PORTABLE PLASMA BASED DIAGNOSTIC APPARATUS AND DIAGNOSTIC METHOD 审中-公开
    基于便携式等离子体诊断设备和诊断方法

    公开(公告)号:WO2010009555A1

    公开(公告)日:2010-01-28

    申请号:PCT/CA2009/001045

    申请日:2009-07-23

    CPC classification number: H01J49/0022 G01N33/6848

    Abstract: A portable plasma based diagnostic apparatus comprising a plasma source for producing energy projectiles at atmospheric pressure, a mass analyzer, a sampling interface for receiving direct sample to be analyzed, the sampling interface being positioned between the plasma source and the mass analyzer, a database containing a library of biomarkers with their associated mass spectra, a processor operatively connected to the plasma source, the mass analyzer and the database. The processor is so configured so as to obtain from the mass analyzer a sample mass spectrum of parent and fragment ions resulting form the collision between the energetic projectiles and the sample, compare the sample mass spectrum with mass spectra in the reference library in order to identify at least one indicator and provide a report based on the at least one identified indicator.

    Abstract translation: 一种便携式等离子体诊断装置,包括用于在大气压下产生能量射弹的等离子体源,质量分析器,用于接收待分析的直接样品的采样接口,位于等离子体源和质量分析器之间的采样接口,包含 具有其相关质谱的生物标志物库,可操作地连接到等离子体源的处理器,质量分析器和数据库。 处理器配置得如此,以便从质量分析器获得由能量弹丸和样品之间的碰撞造成的母体和碎片离子的样品质谱,将样品质谱与参考文库中的质谱进行比较,以鉴定 至少一个指示符并基于所述至少一个识别的指示符提供报告。

    HIGH BRIGHTNESS ELECTRON GUN FOR MASS SPECTROMETRY AND SPECTROSCOPY
    2.
    发明申请
    HIGH BRIGHTNESS ELECTRON GUN FOR MASS SPECTROMETRY AND SPECTROSCOPY 审中-公开
    高亮度电子枪用于大量光谱和光谱

    公开(公告)号:WO2013075203A1

    公开(公告)日:2013-05-30

    申请号:PCT/CA2011/001300

    申请日:2011-11-24

    CPC classification number: H01J49/08 B82Y15/00 H01J3/021 H01J2237/082

    Abstract: The present relates to a high brightness electron gun for mass spectrometry and spectroscopy. The electron gun comprises a nano emission ionization (NEI) electron source, an electrostatic lens system and a control system. The nano emission ionization (NEI) electron source comprises a cathode having a substrate on which are mounted nano-components and an anode. The control system controls the high brightness electron gun, the beam regime and the beam physical proprieties.

    Abstract translation: 本发明涉及用于质谱和光谱学的高亮度电子枪。 电子枪包括纳米发射电离(NEI)电子源,静电透镜系统和控制系统。 纳米发射电离(NEI)电子源包括具有衬底的阴极,其上安装有纳米组分和阳极。 控制系统控制高亮度电子枪,光束状态和光束物理特性。

Patent Agency Ranking