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公开(公告)号:CA2947720C
公开(公告)日:2019-09-10
申请号:CA2947720
申请日:2015-05-01
Applicant: ALCOA INC
Inventor: HUANG WEI , GLOBIG MICHAEL , SPINELLA DONALD J , VEMURI K RAO
Abstract: An apparatus and method for measuring broken spot weld artifacts has a framework for supporting a light and a plurality of cameras for acquiring controlled images of a specimen with minimal distortion and parallax. The framework holds the specimen flat and in a reproducible position, controlling movement while imaging. The image data is received in a computer programmed with image processing software capable of isolating and measuring the artifacts. A calibration standard is used to correct for aberrations.
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公开(公告)号:MX2016014380A
公开(公告)日:2017-05-23
申请号:MX2016014380
申请日:2015-05-01
Applicant: ALCOA INC
Inventor: HUANG WEI , DONALD J SPINELLA , MICHAEL GLOBIG , K RAO VEMURI
IPC: G01N21/88
Abstract: Un aparato y método de medición de artefactos de soldadura rota por puntos tiene una estructura que soporta una lámpara y una pluralidad de cámaras para la obtención de imágenes controladas de una muestra con una distorsión y paralelaje mínimos. La estructura sostiene la muestra plana y en una posición reproducible, controlando el movimiento mientras se forma la imagen. Los datos de imagen son recibidos en una computadora programada con un software de procesamiento de imágenes que aísla y mide los artefactos. Un estándar de calibración se utiliza para corregir los errores o aberraciones.
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公开(公告)号:CA2947720A1
公开(公告)日:2015-11-12
申请号:CA2947720
申请日:2015-05-01
Applicant: ALCOA INC
Inventor: HUANG WEI , GLOBIG MICHAEL , SPINELLA DONALD J , VEMURI K RAO
IPC: G01N21/88
Abstract: An apparatus and method for measuring broken spot weld artifacts has a framework for supporting a light and a plurality of cameras for acquiring controlled images of a specimen with minimal distortion and parallax. The framework holds the specimen flat and in a reproducible position, controlling movement while imaging. The image data is received in a computer programmed with image processing software capable of isolating and measuring the artifacts. A calibration standard is used to correct for aberrations.
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