Capacitive DOE integrity monitor
    2.
    发明专利

    公开(公告)号:AU2016385427B2

    公开(公告)日:2019-02-21

    申请号:AU2016385427

    申请日:2016-12-08

    Applicant: APPLE INC

    Abstract: An optical module includes first and second transparent substrates (22, 23, 40, 42, 82, 84) and a spacer (24, 44, 86) between the first and second transparent substrates, holding the first transparent substrate in proximity to the second transparent substrate, with first and second diffractive optical elements (DOEs) (25, 26, 54, 56, 100, 102) on respective faces of the first and second transparent substrates. At least first and second capacitance electrodes (28, 29, 46, 48, 104, 106) are disposed respectively on the first and second transparent substrates in proximity to the first and second DOEs. Circuitry (34, 66, 96) is coupled to measure changes in a capacitance between at least the first and second capacitance electrodes.

    Capacitive DOE integrity monitor
    3.
    发明专利

    公开(公告)号:AU2016385427A1

    公开(公告)日:2018-06-28

    申请号:AU2016385427

    申请日:2016-12-08

    Applicant: APPLE INC

    Abstract: An optical module includes first and second transparent substrates (22, 23, 40, 42, 82, 84) and a spacer (24, 44, 86) between the first and second transparent substrates, holding the first transparent substrate in proximity to the second transparent substrate, with first and second diffractive optical elements (DOEs) (25, 26, 54, 56, 100, 102) on respective faces of the first and second transparent substrates. At least first and second capacitance electrodes (28, 29, 46, 48, 104, 106) are disposed respectively on the first and second transparent substrates in proximity to the first and second DOEs. Circuitry (34, 66, 96) is coupled to measure changes in a capacitance between at least the first and second capacitance electrodes.

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