ELECTRONIC DEVICE WITH DYNAMIC NOISE SPECTRUM CONTROL
    1.
    发明申请
    ELECTRONIC DEVICE WITH DYNAMIC NOISE SPECTRUM CONTROL 审中-公开
    具有动态噪声频谱控制的电子设备

    公开(公告)号:WO2013133933A1

    公开(公告)日:2013-09-12

    申请号:PCT/US2013/025618

    申请日:2013-02-11

    Applicant: APPLE INC.

    CPC classification number: H03L7/00 H04B1/123 H04B15/06 H04B2215/067

    Abstract: An electronic device may contain clock circuits, transmitters, and other circuits that serve as sources of noise signals. The noise signals may be characterized by a noise spectrum. The noise spectrum produced by a noise source can be adjusted by adjusting spread spectrum clock circuitry in a clock circuit, by adjusting data scrambling circuitry in a transmitter circuit, or by making other dynamic adjustments to the circuitry of the electronic device. During operation of the electronic device, sensitive circuitry in the device such as wireless receiver circuitry may be adversely affected by the presence of noise from a noise source in the device. Based on information such as which receiver bands and/or channels are being actively received and target sensitivity levels for the receiver circuitry, control circuitry within the electronic device can determine in real time how to minimize interference between the noise source and the wireless receiver circuitry.

    Abstract translation: 电子设备可以包含用作噪声信号源的时钟电路,发射器和其它电路。 噪声信号可以由噪声谱表征。 可以通过调整时钟电路中的扩频时钟电路,通过调整发射机电路中的数据加扰电路,或通过对电子设备的电路进行其他动态调整来调整由噪声源产生的噪声频谱。 在电子设备的操作期间,诸如无线接收器电路的设备中的敏感电路可能受到来自设备中的噪声源的噪声的存在的不利影响。 基于诸如接收机频带和/或频道被主动接收的信息以及接收机电路的目标灵敏度级别,电子设备内的控制电路可以实时地确定如何最小化噪声源和无线接收机电路之间的干扰。

    METHOD AND APPARATUS FOR POWER GLITCH DETECTION IN INTEGRATED CIRCUITS
    2.
    发明申请
    METHOD AND APPARATUS FOR POWER GLITCH DETECTION IN INTEGRATED CIRCUITS 审中-公开
    集成电路中功率检测的方法与装置

    公开(公告)号:WO2015006036A1

    公开(公告)日:2015-01-15

    申请号:PCT/US2014/043584

    申请日:2014-06-23

    Applicant: APPLE INC.

    CPC classification number: G01R31/31721 G01R19/16552 G01R31/31816 G06F1/28

    Abstract: A method and apparatus for power glitch detection in ICs is disclosed. In one embodiment, a method includes a detection circuit in an IC detecting a voltage transient wherein a value of a supply voltage has at least momentarily fallen below a reference voltage value. Responsive thereto, the detection circuit may cause a logic value to be stored in a register indicating that the detection circuit has detected the supply voltage falling below the reference voltage. The IC may include a number of detection circuits coupled to the register, each of which may provide a corresponding indication of detecting the supply voltage falling below the reference voltage. The detection circuits may be placed at different locations, and thus reading the register may yield information indicating the locations where, if any, such voltage transients occurred.

    Abstract translation: 公开了一种用于IC中的电源毛刺检测的方法和装置。 在一个实施例中,一种方法包括检测电压瞬变的IC中的检测电路,其中电源电压的值至少暂时低于参考电压值。 响应于此,检测电路可以使逻辑值存储在指示检测电路已经检测到低于参考电压的电源电压的寄存器中。 IC可以包括耦合到寄存器的多个检测电路,每个检测电路可以提供检测低于参考电压的电源电压的相应指示。 检测电路可以放置在不同的位置,因此读取寄存器可以产生指示出现这种电压瞬变的位置(如果有的话)的信息。

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