公开(公告)号：WO2015156923A1

公开(公告)日：2015-10-15

申请号：PCT/US2015/018588

申请日：2015-03-04

Applicant: APPLE INC.

Inventor： WHIPPLE, Lucas Allen ,  LANCASTER-LAROQUE, Simon Regis Louis ,  CHAN, Collin D. ,  FAGAN, Christopher R. ,  YAN, Vincent ,  THEILACKER, Ian S. ,  MIEHM, Brian K. ,  BHARADWAJ, Shravan

IPC: B24B49/14 ,  B24B33/04

CPC classification number: B24B27/0038 ,  B24B5/04 ,  B24B9/00 ,  B24B49/14

Abstract: A method and system for observing and monitoring thermal characteristics of a machining operation, such as a surface finishing operation, performed on a workpiece is disclosed. The surface finishing operation can be performed on the workpiece in order to remove a surface defect, e.g. a parting line, on a surface of the workpiece and/or to provide a mirror-like finish to the workpiece. In one embodiment, an emissive layer is applied to the workpiece to increase a thermal emissivity of the workpiece. In some embodiments, a finishing surface, such as a polishing or buffing wheel, and/or a lubricant used in a finishing operation is monitored. A thermal profile of the surface of the workpiece, finishing surface and/or lubricant can be obtained. The finishing operation can be modified in response to the monitored thermal characteristics to prevent the occurrence of defects and improve the efficacy of the finishing operation.

Abstract translation: 公开了一种用于观察和监测对工件执行的诸如表面精加工操作的加工操作的热特性的方法和系统。 可以在工件上执行表面精加工操作，以便去除表面缺陷，例如， 分切线，在工件的表面上和/或为工件提供镜面状的光洁度。 在一个实施例中，发射层被施加到工件以增加工件的热辐射率。 在一些实施例中，监视在整理操作中使用的精加工表面，例如抛光轮或抛光轮和/或润滑剂。 可以获得工件表面，精加工表面和/或润滑剂的热分布。 可以响应于所监测的热特性来修改整理操作，以防止缺陷的发生并提高整理操作的功效。

公开(公告)号：WO2013049041A1

公开(公告)日：2013-04-04

申请号：PCT/US2012/057079

申请日：2012-09-25

Applicant: APPLE INC.

Inventor： LANCASTER-LAROCQUE, Simon Regis Louis ,  WHIPPLE, Lucas Allen

IPC: B24B49/12 ,  B24B37/00

CPC classification number: B24B49/12 ,  B24B51/00

Abstract: The described embodiment relates generally to the polishing of a device housing. The device housing can be formed of a thermoplastic, or a metal such as aluminum or stainless steel. More particularly, a method and an apparatus are described for accurately measuring the amount of material removed during a polishing process. Accurate measurement of such a polishing process can be especially helpful in measuring material removal on curved surfaces and edges where material removal rates tend to be less predictable.

Abstract translation: 所描述的实施例一般涉及设备外壳的抛光。 装置壳体可以由热塑性材料或诸如铝或不锈钢的金属形成。 更具体地，描述了用于精确测量抛光过程中去除的材料量的方法和装置。 对这种抛光工艺的精确测量可以特别有助于测量材料去除率倾向于较不可预测的曲面和边缘上的材料去除。

公开(公告)号：WO2016036364A1

公开(公告)日：2016-03-10

申请号：PCT/US2014/053921

申请日：2014-09-03

Applicant: APPLE INC.

Inventor： WHIPPLE, Lucas Allen

IPC: G01N21/892 ,  H04N5/225 ,  G03B13/00 ,  G02B27/02 ,  G02B27/10 ,  G02B13/10

CPC classification number: G06T7/0004 ,  G06K9/46 ,  G06K9/52 ,  G06K9/6201 ,  G06K2009/4666 ,  G06T7/557 ,  G06T2207/10028 ,  G06T2207/10052 ,  G06T2207/30164 ,  H04N5/2254 ,  H04N13/232

Abstract: The disclosed embodiments relate to using a plenoptic camera in a manufacturing system for various imaging operations. The embodiments include calculating a distance of a manufactured part from a light source or plenoptic camera for further use by a robotic device in the manufacturing system. The embodiments further include compiling a composite two-dimensional or three-dimensional image of a manufactured part in order to derive dimensions of the manufactured part for use by the manufacturing system. Additionally, the embodiments include performing a profile analysis of a surface of a manufactured part based on image data captured by the plenoptic camera. Furthermore, the embodiments discussed herein can be performed on a still or moving manufactured part in order to optimize one or more manufacturing processes.

Abstract translation: 所公开的实施例涉及在用于各种成像操作的制造系统中使用全光摄像机。 这些实施例包括计算制造的部件与光源或全光相机的距离，以供制造系统中的机器人装置进一步使用。 实施例还包括编制制造部件的复合二维或三维图像，以便导出由制造系统使用的制造部件的尺寸。 此外，实施例包括基于由全光照相机捕获的图像数据来执行制造部件的表面的轮廓分析。 此外，本文讨论的实施例可以在静止或移动的制造部件上执行，以便优化一个或多个制造过程。