公开(公告)号：AU2563199A

公开(公告)日：1999-08-23

申请号：AU2563199

申请日：1999-01-26

Applicant: APPLIED SCIENCE FICTION INC

Inventor： EDGAR ALBERT D ,  PENN STEVEN C

IPC: H04N1/04 ,  H04N1/48 ,  H04N9/11

Abstract: Surface defect correction technology for photographic images requires an infrared scan along with a conventional color scan. In the present invention, the additional infrared scan needed for surface defect correction is obtained by adding a line of sensors specific to infrared light to a conventional multilinear color sensor array. The invention teaches a practical mode of distinguishing infrared light using a dichroic prism placed over the sensor. This mode has the additional advantage of placing the infrared-specific sensor line in a displaced focus plane to match conventional lenses. Adding a sensor line to a conventional trilinear sensor array requires a quadrilinear array topology. In addition to the direct quadrilinear topology, the invention teaches a method of obtaining full color image information with only two linear sensor lines by interstitially mixing red and blue sensors on a single sensor line, which, in conjunction with the additional infrared line, results in a conventional trilinear sensor topology with a different filter arrangement.