公开(公告)号：DE59605528D1

公开(公告)日：2000-08-10

申请号：DE59605528

申请日：1996-02-06

Applicant: BASF AG

Inventor： HORN DR ,  KELLER DR ,  SCHREPP DR ,  AKARI DR

IPC: G01B21/30 ,  G01B7/34 ,  G01L1/25 ,  G01N19/00 ,  G01Q60/42 ,  G11C13/02 ,  H01J37/28

Abstract: The method for chemically differential imaging using a scanning force microscope uses chemically modified samples, where the imaging is in normal force, elasticity or tapping/non-contact mode. A detector (1), laser source (2), piezoelectric adjuster (3), tip and lever arm (4) are used to evaluate the sample (5). The scanning tip is either a metal or oxide layer, or it may be coated with one or more substances, such as thiol groups with additional acid or base functions, thiol with nuclein base, disulphide with acid base or nuclein base.