公开(公告)号：JPH09113448A

公开(公告)日：1997-05-02

申请号：JP23227196

申请日：1996-09-02

Applicant: BASF AG

Inventor： BUORUFUGANGU SHIYUROFU ,  YURUGEN KURINGAA ,  DEIITAA HORUN ,  ERUMAARU MAIAA

IPC: G01N21/64

Abstract: PROBLEM TO BE SOLVED: To realize quick inspection of a sample at low cost by bounding or defining a plurality of focusing regions in an equipment such that a sample arranged in a focusing region is pumped with only one laser and the samples are observed in parallel thereby inspecting the entirety with only one laser. SOLUTION: Light from a pulse laser 1 is introduced through the objective lenses 2a, 2b, 2n of microscope and measuring cells 3a, 3b, 3n before being focused. A sample is set in each focusing region 6a, 6b, 6n. Particle fluorescence in the sample is detected by optically focusing on photomultiplier tubes 7a, 7b, 7n through lenses 4a, 4b, 4n. Filters 5a, 5b, 5n are fixed in front of the multiplier tubes 7a, 7b, 7n. Information from the multiplier tubes 7a, 7b, 7n is introduced to an evaluation electronic unit 8 and processed. A measuring method for determining the diffusion characteristics of particles labeled by fluorescence can be carried out in parallel.