BE-AXIAL PROBE
    2.
    发明专利

    公开(公告)号:AU510631B2

    公开(公告)日:1980-07-03

    申请号:AU2911477

    申请日:1977-09-26

    Applicant: BENDIX CORP

    Abstract: A probe for measuring coordinate positions on an object by sensing a displacement of the stylus which contacts the object. The probe is responsive to forces which result from the contact between the object and the stylus to indicate coordinate positions of the object. The probe includes a replaceable stylus having a shank portion defining an axis, with a transversely-extending portion extending from the shank portion for sensing forces exerted by objects in the axial direction away from the probe, while the stylus shank portion is responsive to forces in the radial and axial (toward the probe) directions. The probe is thus responsive to forces exerted on the stylus in any direction.

    3.
    发明专利
    未知

    公开(公告)号:DE2743665A1

    公开(公告)日:1978-04-20

    申请号:DE2743665

    申请日:1977-09-28

    Applicant: BENDIX CORP

    Abstract: A probe for measuring coordinate positions on an object by sensing a displacement of the stylus which contacts the object. The probe is responsive to forces which result from the contact between the object and the stylus to indicate coordinate positions of the object. The probe includes a replaceable stylus having a shank portion defining an axis, with a transversely-extending portion extending from the shank portion for sensing forces exerted by objects in the axial direction away from the probe, while the stylus shank portion is responsive to forces in the radial and axial (toward the probe) directions. The probe is thus responsive to forces exerted on the stylus in any direction.

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