公开(公告)号：US20240288376A1

公开(公告)日：2024-08-29

申请号：US18023810

申请日：2022-03-01

Applicant: BOE TECHNOLOGY GROUP CO., LTD.

Inventor： Xing Li ,  Ruize Li ,  Hao Tang ,  Ronghua Lan ,  Jiuyang Cheng ,  Meng Guo ,  Zhihui Yang ,  Qing Zhang ,  Xuehui Zhu ,  Quanguo Zhou ,  Lijia Zhou ,  Yong Qiao ,  Zhong Huang ,  Lirong Xu

IPC: G01N21/88 ,  G01N21/89 ,  G01N21/892 ,  G06T7/00 ,  G06T7/13 ,  G06V10/44 ,  H10K71/70

CPC classification number: G01N21/8851 ,  G01N21/892 ,  G06T7/0004 ,  G06T7/13 ,  G06V10/44 ,  G01N2021/8887 ,  G01N2021/891 ,  G01N2201/0438 ,  G01N2201/06146 ,  G06T2207/30108 ,  H10K71/70

Abstract: A curved substrate bubble detection method includes: providing, by a first light source and a second light source, parallel light incident to a to-be-tested substrate in different incident directions; obtaining, by a linear array camera, a first image including image information of a first side edge of the to-be-tested substrate; determining location information of a defect region of the to-be-tested substrate according to the first image, and generating a second image including image information of the defect region; binarizing the second image, and determining that the to-be-tested substrate has a bubble defect if there are at least two bright spots in an obtained binarized image, and a distance between any two first bright spots of at least two first bright spots is less than a first preset value. A curved substrate bubble detection system is also disclosed.