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    MULTIPLEXED ASSAY SYSTEMS AND METHODS
    1.
    发明申请
    MULTIPLEXED ASSAY SYSTEMS AND METHODS 审中-公开

    公开(公告)号：WO2020086583A1

    公开(公告)日：2020-04-30

    申请号：PCT/US2019/057442

    申请日：2019-10-22

    Applicant: BIOELECTRONICA CORPORATION

    Inventor： CHEN, Roger ,  HULL, Jonathan F.

    IPC: G01N21/01 ,  G01N21/64 ,  G01N33/76

    Abstract: A system for processing a sample includes a chamber for receiving a sample, at least one light source, and an imager array configured to generate a sample image of the sample in the chamber. The system can be used to process a sample in a multiplexed manner. For example, one variation of a method for processing a sample includes identifying one or more features of interest in the sample based at least in part on the forms and/or darkness shift of one or more marker particles depicted in the sample image. Another variation of a method includes illuminating the sample with light having a wavelength outside a wavelength detection window of the imager array, to thereby induce at least a portion of the sample to fluoresce light within the wavelength detection window.

    ASSAY SYSTEMS AND METHODS FOR PROCESSING SAMPLE ENTITIES
    3.
    发明申请
    ASSAY SYSTEMS AND METHODS FOR PROCESSING SAMPLE ENTITIES 审中-公开

    公开(公告)号：WO2018217802A1

    公开(公告)日：2018-11-29

    申请号：PCT/US2018/033955

    申请日：2018-05-22

    Applicant: BIOELECTRONICA CORPORATION

    Inventor： HULL, Jonathan, F. ,  TOMASZ, Martin ,  CHEN, Roger

    IPC: G01N15/10 ,  G01N27/02

    Abstract: A system for processing sample entities includes a chamber including a surface having an array of measurement regions, wherein at least one measurement region comprises a first set of one or more electrodes and a second set of one or more electrodes, wherein the first set of electrodes is configured to measure a first characteristic of a sample entity when the sample entity is traversing the first set of electrodes, and wherein the second set of electrodes is configured to selectively retain the sample entity in the at least one measurement region based at least in part on the measured first characteristic and/or measure a second characteristic of the sample entity.

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