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公开(公告)号:JPH02181665A
公开(公告)日:1990-07-16
申请号:JP29012789
申请日:1989-11-09
Applicant: CASCADE MICROTECH INC
Inventor: BAANAADO DABURIYUU RIIKU , ANDORIYUU SHII DEBITSUDOSON
Abstract: PURPOSE: To compensate the error by sequentially sending signals having different frequencies, and measuring the inaccuracy of measured frequency of from the noise current of a DUT by the frequency measured at a scattered parameter. CONSTITUTION: The input terminal of a unit DUT 12 during testing is connected to a source admittance 14, and the output terminal is connected to a noise wattmeter 16. In this case, signals having the same power and different frequencies are successively sent from the input terminal to the wattmeter 16. The signals are amplified in the selected narrow frequency range by a frequency converting stage 18. The wattmeter 16 individually measures the power for the signals having the various different frequencies, and measures the central frequency of the signals. Thus, the power measured and larger individually than the threshold measured in the frequency range is obtained. In this case, the difference of the desired measuring frequency, central frequency can be measured. The signal from the DUT 12 is moved by the difference, and the measurement error can be compensated.
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公开(公告)号:JPH02170060A
公开(公告)日:1990-06-29
申请号:JP27619389
申请日:1989-10-25
Applicant: CASCADE MICROTECH INC
Abstract: PURPOSE: To measure a noise power being used simultaneously by combining the 1port tuners of a device being tested and measuring the noise power at different frequencies. CONSTITUTION: A noise parameter system 10 has an automatic circuit analyzer 12, an input box 14, an output box 18, a power distributor 20, a plurality of noise meters 22, and a calibrated sound sources 24. Also, a down-converter stage 19 is provided between the output box 18 and the power distributor 20, and further a device (DUT) 16 being tested is provided between the input box 14 and the output box 18. The input box 14 has a 1-port tuner 28 and connects a 3-position switch 30 to the input port of the DUT 16 via a terminal 31, thus connecting a circuit net analyzer 12 or a noise source 24 selectively. In this manner, the noise of the device being tested is measured within a different frequency range.
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