PROBE STATION
    1.
    发明专利

    公开(公告)号:JPH0653293A

    公开(公告)日:1994-02-25

    申请号:JP13596393

    申请日:1993-06-07

    Abstract: PURPOSE: To obtain a probe station having Kelvin connection and shielding system which is immediately applicable and protective by installing a detachable electric connector assembly on a chuck assembly, having connector elements which are connected, in a pair relation, with first and second chuck assemblies. CONSTITUTION: This probe station is provided with an integrated protective system which facilitates the use of a station for measuring a small current, and integrated Kelvin connection for eliminating voltage loss due to line resistance. The station has a chuck assembly 20 constituted of three chuck assembly elements 80, 81, 83. The first element 80 retains a test equipment. The second element 81 under the first element acts as a protective body for reducing a leakage current. The elements 80, 81 are electrically insulating from each other and from a retaining structure, which is the third element 83 located below.

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