MICRO DEVICE UNDER TEST CARRIER
    1.
    发明公开

    公开(公告)号:US20230204659A1

    公开(公告)日:2023-06-29

    申请号:US17981167

    申请日:2022-11-04

    CPC classification number: G01R31/2889

    Abstract: A micro device under test (DUT) carrier includes a carrier main body, a pusher and a spring. The carrier main body includes a plurality of bearing stages. Each bearing stage is utilized to bear a micro DUT. The pusher, operated to move from a locking position to an opening position, includes a pusher main body and a plurality of locking elements. Each locking element corresponds to each bearing stage, and is located next to each bearing stage. The spring is utilized to send the pusher back to the locking position, so that each locking element restricts movement of each micro DUT.

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