公开(公告)号：US12015239B2

公开(公告)日：2024-06-18

申请号：US17536153

申请日：2021-11-29

Applicant: CHROMA ATE INC.

Inventor： Sheng-Hung Wang ,  Po-Hsiang Chang

IPC: H01S5/00 ,  G01R31/26

CPC classification number: H01S5/0014 ,  G01R31/2635

Abstract: The present invention relates to a laser diode testing system and a laser diode testing method. The method comprises the steps of moving a laser bar or a plurality of laser diodes to a first test station by means of a first transfer device; then, electrically contacting each laser diode by a first probe module in sequence; measuring electrical and optical characteristics of the laser diodes electrically contacted by the first probe module sequentially by means of a first measuring device; moving the laser bar or the plurality of laser diodes out of the first test station by means of the first transfer device, wherein a magnetic field generated by an electromagnetic generating unit of an electromagnetic slide interacts with a magnetic field of a permanent magnet of the first transfer device, so that the first transfer device is driven and moved.