公开(公告)号：US20150022231A1

公开(公告)日：2015-01-22

申请号：US14333282

申请日：2014-07-16

Applicant: CHROMA ATE INC.

Inventor： Yi-Chiao Lee ,  Xin-Yi Wu

IPC: G01R31/28

CPC classification number: G01R31/2867 ,  G01R31/2849 ,  G01R31/2874

Abstract: A test apparatus includes a sector conveyance device provided with a plurality of soaking buffers, the soaking buffers being used to carry electronic components, the sector conveyance device being mounted pivotably by a pivot and moved between a test location and a transferring location; a transferring device arranged in correspondence to the transferring location, used to transfer a plurality of electronic components into or out of the sector conveyance device; and a test device arranged in correspondence to the test location for testing electronic components, the electronic components being transferred into the sector conveyance device after test.

Abstract translation: 一种测试装置，包括设置有多个浸泡缓冲器的扇区输送装置，所述均热缓冲器用于承载电子部件，所述扇区传送装置由枢轴可枢转地安装并在测试位置和传送位置之间移动; 传送装置，其对应于所述传送位置布置，用于将多个电子部件传送到所述扇区传送装置中或从所述扇区传送装置传出; 以及与测试电子部件的测试位置对应地配置的测试装置，电子部件在测试后被传送到扇区传送装置。