1.
    发明专利
    未知

    公开(公告)号:DE60034121D1

    公开(公告)日:2007-05-10

    申请号:DE60034121

    申请日:2000-02-01

    Applicant: COM DEV LTD

    Abstract: A system and method of calibrating an S parameter measurement instrument (such as a vector network analyzer) in which the number of calibrations required to fully characterize the error model of an n-port system is n/2 calibrations for an even number of ports and (n+1)/2 calibrations for an odd number of ports. Each test port in the system is involved in at least one full calibration, thus n/2 test paths are fully calibrated. For each measured test path, the error terms of the applicable error model are calculated. These error terms are then decoupled from the associated test path into error parameters that are localized to the individual test ports of the test path. Having localized the error parameters, the error model for each test port can then be treated independently from the other test ports. The error terms for the test paths that are not calibrated are then constructed using the localized error parameters for the individual test ports.

    2.
    发明专利
    未知

    公开(公告)号:DE60034121T2

    公开(公告)日:2007-11-08

    申请号:DE60034121

    申请日:2000-02-01

    Applicant: COM DEV LTD

    Abstract: A system and method of calibrating an S parameter measurement instrument (such as a vector network analyzer) in which the number of calibrations required to fully characterize the error model of an n-port system is n/2 calibrations for an even number of ports and (n+1)/2 calibrations for an odd number of ports. Each test port in the system is involved in at least one full calibration, thus n/2 test paths are fully calibrated. For each measured test path, the error terms of the applicable error model are calculated. These error terms are then decoupled from the associated test path into error parameters that are localized to the individual test ports of the test path. Having localized the error parameters, the error model for each test port can then be treated independently from the other test ports. The error terms for the test paths that are not calibrated are then constructed using the localized error parameters for the individual test ports.

    SCATTERING PARAMETER CALIBRATION SYSTEM AND METHOD

    公开(公告)号:CA2361666C

    公开(公告)日:2005-11-01

    申请号:CA2361666

    申请日:2000-02-01

    Applicant: COM DEV LTD

    Abstract: A system and method of calibrating an S parameter measurement instrument (such as a vector network analyzer) in which the number of calibrations required to fully characterize the error model of an n-port system is n/2 calibrations for an even number of ports and (n+1)/2 calibrations for an odd number of ports. Each test port in the system is involved in at least one full calibration, thus n/2 test paths are fully calibrated. For each measured test path, the error terms of the applicable error model are calculated. These error teens are then decoupled from the associated test path into error parameters that are localized to the individual test ports of the test path. Having localized the error parameters, the error model for each test port can then be treated independently from the other test ports. The error terms for the test paths that are not calibrated are then constructed using the localized error parameters for the individual test ports.

    SCATTERING PARAMETER CALIBRATION SYSTEM AND METHOD

    公开(公告)号:CA2361666A1

    公开(公告)日:2000-08-10

    申请号:CA2361666

    申请日:2000-02-01

    Applicant: COM DEV LTD

    Abstract: A system and method of calibrating an S parameter measurement instrument (su ch as a vector network analyzer) in which the number of calibrations required t o fully characterize the error model of an n-port system is n/2 calibrations f or an even number of ports and (n+1)/2 calibrations for an odd number of ports. Each test port in the system is involved in at least one full calibration, thus n/2 test paths are fully calibrated. For each measured test path, the error terms of the applicable error model are calculated. These error terms are then decoupled from the associated test path into error parameters that are localized to the individual test ports of the test path. Having localize d the error parameters, the error model for each test port can then be treated independently from the other test ports. The error terms for the test paths that are not calibrated are then constructed using the localized error parameters for the individual test ports.

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