Method of phase quality control for glass ceramics in manufacturing

    公开(公告)号:US11204280B2

    公开(公告)日:2021-12-21

    申请号:US16804219

    申请日:2020-02-28

    Abstract: A method for determining crystal phases of a glass ceramic sample, including the steps of applying energy to the sample using an excitation source, detecting raw Raman spectral energy that is given off by the sample using a detector, wherein the raw Raman spectral energy includes peak values, determining a plurality of predetermined energy peaks based off a composition of the sample, superimposing the plurality of predetermined energy peaks over the raw Raman spectral energy, applying a baseline value between each predetermined energy peak, subtracting the baseline value from the raw Raman spectral energy, calculating corrected peak values based on the raw Raman spectral energy and baseline value, and determining the crystal phases of the glass ceramic sample based on the corrected peak values.

    METHOD OF PHASE QUALITY CONTROL FOR GLASS CERAMICS IN MANUFACTURING

    公开(公告)号:US20200278254A1

    公开(公告)日:2020-09-03

    申请号:US16804219

    申请日:2020-02-28

    Abstract: A method for determining crystal phases of a glass ceramic sample, including the steps of applying energy to the sample using an excitation source, detecting raw Raman spectral energy that is given off by the sample using a detector, wherein the raw Raman spectral energy includes peak values, determining a plurality of predetermined energy peaks based off a composition of the sample, superimposing the plurality of predetermined energy peaks over the raw Raman spectral energy, applying a baseline value between each predetermined energy peak, subtracting the baseline value from the raw Raman spectral energy, calculating corrected peak values based on the raw Raman spectral energy and baseline value, and determining the crystal phases of the glass ceramic sample based on the corrected peak values.

    Method and system for measuring thickness of glass article

    公开(公告)号:US10295330B2

    公开(公告)日:2019-05-21

    申请号:US15315527

    申请日:2015-06-04

    Abstract: A method includes introducing light into a glass article such that at least a portion of the introduced light is emitted from an edge of the glass article. The light emitted from an edge of the glass article is detected. An intensity profile of the emitted light is an intensity of the emitted light as a function of axial position. A first intensity boundary of the intensity profile and a second intensity boundary of the intensity profile are determined. A thickness of a layer of the glass article is determined based on an axial distance between the first intensity boundary and the second intensity boundary.

    Apparatus and method for inspecting laser defect inside of transparent material

    公开(公告)号:US12292387B2

    公开(公告)日:2025-05-06

    申请号:US17928005

    申请日:2021-05-25

    Abstract: A method for inspecting a transparent workpiece comprises: directing light from an illumination source onto a plurality of defects formed in the transparent workpiece, wherein the plurality of defects extends in a defect direction, wherein the transparent workpiece comprises a first surface and a second surface; detecting a scattering image signal from light scattered by the plurality of defects using an imaging system, wherein an imaging axis of the imaging system extends at a non-zero imaging angle relative to the defect direction, wherein entireties of at least a subset of the plurality of defects are within a depth of field of the imaging system; and generating a three-dimensional image of at least one of the plurality of defects based on the scattering signal.

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