2.
    发明专利
    未知

    公开(公告)号:ITTO960168A1

    公开(公告)日:1997-09-08

    申请号:ITTO960168

    申请日:1996-03-06

    Abstract: A probe for fault-actuation devices has a transistor which is utilized to insert a reference signal into a fault-insertion point. The emitter and collector are connectable to the fault-insertion point and a reference signal and a capacitor with a capacitance greater than the capacitance of parasitic components is connected between the base and the emitter.

    3.
    发明专利
    未知

    公开(公告)号:IT1320393B1

    公开(公告)日:2003-11-26

    申请号:ITTO20000527

    申请日:2000-06-05

    Abstract: Process for the electromagnetic modelling of electronic components and systems, for the extraction of certain electrical parameters, such as the static V-I characteristics and the input and output impedance, the output switching times in particular conditions of load and the transition times of the protection diodes. A test machine of the commercial type is used for these measurements, by generating stimulus signals and measuring the correlated signals, the test machine being suitable for parametric direct current measurements, functional tests and digital integrated circuit timing and also being used as a time domain reflectometer. The measurement phase is followed by a simulation phase during which the electric parameters used for modelling electronic components and systems are extracted.

    4.
    发明专利
    未知

    公开(公告)号:NO315537B1

    公开(公告)日:2003-09-15

    申请号:NO984598

    申请日:1998-10-01

    Abstract: An electronic telecommunications module has circuit components and conductors forming a telecommunications circuit having insertion points at which signals can be applied for test purposes and monitoring points from which responses can be tapped. The insertion and monitoring probes are mounted on the module and are connected to the respective points by shielded microcoaxial cables and the probes are connected by shield and microcoaxial cables on the connectors to allow interfacing between the particular module and the testing and diagnostic system.

    5.
    发明专利
    未知

    公开(公告)号:IT1286293B1

    公开(公告)日:1998-07-08

    申请号:ITTO960256

    申请日:1996-04-02

    Abstract: An electronic telecommunications module has circuit components and conductors forming a telecommunications circuit having insertion points at which signals can be applied for test purposes and monitoring points from which responses can be tapped. The insertion and monitoring probes are mounted on the module and are connected to the respective points by shielded microcoaxial cables and the probes are connected by shield and microcoaxial cables on the connectors to allow interfacing between the particular module and the testing and diagnostic system.

    CONSTRUCTIVE MODULE OF AN ELECTRONIC TELECOMMUNICATIONS EQUIPMENT, WITH AN INTERFACE TOWARDS A TESTING AND DIAGNOSING SYSTEM

    公开(公告)号:CA2250703A1

    公开(公告)日:1997-10-09

    申请号:CA2250703

    申请日:1997-04-01

    Abstract: A constructive module (1) of an electronic telecommunications equipment is associated with means (4, 5, 6, 7, 8, 9) interfacing it with a testing and diagnosing system. Said means can be connected at least temporarily and in noninvasive fashion and comprise: actuation probes (4), driven by control signals provided by the testing and diagnosing system, for the automatic and programmed insertion of test signals into predetermined points of the module, and monitoring probes (5) for taking from the monitoring points and transferring to the testing and diagnosing system signals present in the module. The probes (4, 5) are connected with the testing and diagnosing system by means of shielded micro-coaxial cables (7, 9). Conditioning devices (17), associated with the cables (7) connected to the actuation probes (4), provide a galvanic isolation between the testing and diagnosing system and the modules (1) under test.

    7.
    发明专利
    未知

    公开(公告)号:AT206525T

    公开(公告)日:2001-10-15

    申请号:AT97908176

    申请日:1997-03-05

    Abstract: A probe for fault-actuation devices has a transistor which is utilized to insert a reference signal into a fault-insertion point. The emitter and collector are connectable to the fault-insertion point and a reference signal and a capacitor with a capacitance greater than the capacitance of parasitic components is connected between the base and the emitter.

    8.
    发明专利
    未知

    公开(公告)号:NO983884D0

    公开(公告)日:1998-08-24

    申请号:NO983884

    申请日:1998-08-24

    Abstract: A probe for fault-actuation devices has a transistor which is utilized to insert a reference signal into a fault-insertion point. The emitter and collector are connectable to the fault-insertion point and a reference signal and a capacitor with a capacitance greater than the capacitance of parasitic components is connected between the base and the emitter.

    CONSTRUCTIVE MODULE OF AN ELECTRONIC TELECOMMUNICATIONS EQUIPMENT, WITH AN INTERFACE TOWARDS A TESTING AND DIAGNOSING SYSTEM

    公开(公告)号:CA2250703C

    公开(公告)日:2002-07-09

    申请号:CA2250703

    申请日:1997-04-01

    Abstract: A constructive module (1) of an electronic telecommunications equipment is associated with means (4, 5, 6, 7, 8, 9) interfacing it with a testing and diagnosing system. Said means can be connected at least temporarily and in n on- invasive fashion and comprise: actuation probes (4), driven by control signa ls provided by the testing and diagnosing system, for the automatic and programmed insertion of test signals into predetermined points of the module , and monitoring probes (5) for taking from the monitoring points and transferring to the testing and diagnosing system signals present in the module. The probes (4, 5) are connected with the testing and diagnosing syst em by means of shielded micro-coaxial cables (7, 9). Conditioning devices (17), associated with the cables (7) connected to the actuation probes (4), provid e a galvanic isolation between the testing and diagnosing system and the modul es (1) under test.

    10.
    发明专利
    未知

    公开(公告)号:DE69707108D1

    公开(公告)日:2001-11-08

    申请号:DE69707108

    申请日:1997-03-05

    Abstract: A probe for fault-actuation devices has a transistor which is utilized to insert a reference signal into a fault-insertion point. The emitter and collector are connectable to the fault-insertion point and a reference signal and a capacitor with a capacitance greater than the capacitance of parasitic components is connected between the base and the emitter.

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