公开(公告)号：EP4556870A1

公开(公告)日：2025-05-21

申请号：EP24211319.9

申请日：2024-11-07

Applicant: Chroma ATE Inc.

Inventor： Chiu, I-Chang ,  Chien, Hung-Ta ,  Lin, Yu-Shuan ,  Hsu, Shih-Min ,  Chen, Li-Yang ,  Ou, Tsung-Hsien

IPC: G01J3/46 ,  G01B11/25 ,  G01M11/02 ,  G03B21/26 ,  G01J3/10

Abstract: A system and a method for calibration of optical measurement devices are described. In one embodiment, the optical measurement device (CM) comprises an imaging lens (CL), and the calibration system (1) includes a projection light source (2), a lens module (4), and a projection element (3). The light emitted from the projection light source (2) passes through the projection element (3) and is projected by the lens module (4), and then captured by the imaging lens (CL) of the optical measurement device (CM). The exit pupil (ExP) of the lens module (4) in the calibration system (1) is coincident with the entrance pupil (EnP) of the imaging lens (CL) of the optical measurement device (CM), providing a compact and highly efficient optical calibration mechanism.