公开(公告)号：WO2008101732A1

公开(公告)日：2008-08-28

申请号：PCT/EP2008/001468

申请日：2008-02-25

Applicant: ESE EMBEDDED SYSTEM ENGINEERING GMBH ,  GRULER, Roman ,  FAULSTICH, Konrad

Inventor： GRULER, Roman ,  FAULSTICH, Konrad

IPC: G01N21/64

CPC classification number: G01N21/645 ,  G01N21/255 ,  G01N21/8483 ,  G01N2201/0228 ,  G01N2201/024

Abstract: The invention provides for an optical measuring instrument and measuring device. The optical measuring instrument for investigating a specimen contained in a sample comprises at least one source for providing at least one electromagnetic beam intended to irradiate the sample and to interact with the specimen within the sample, at least one sensor for detecting an output of the interaction between the specimen and the electromagnetic beam, an integrally formed mechanical bench for the optical and electronic components, a sample holder for holding the sample, wherein the at least one source, the at least one sensor, and the mechanical bench are integrated in one monolithic optoelectronic module and the sample holder can be connected to this module.

Abstract translation: 本发明提供一种光学测量仪器和测量装置。 用于调查包含在样品中的样本的光学测量仪器包括至少一个源，用于提供用于照射样品的至少一个电磁束并与样品内的样品相互作用，用于检测相互作用的输出的至少一个传感器 在样品和电磁束之间，用于光学和电子部件的整体形成的机械台，用于保持样品的样品保持器，其中所述至少一个源，所述至少一个传感器和所述机械台被集成在一个单片 光电模块和样品架可以连接到该模块。

公开(公告)号：EP2115434A1

公开(公告)日：2009-11-11

申请号：EP08716013.1

申请日：2008-02-25

Applicant: ESE Embedded System Engineering GmbH

Inventor： GRULER, Roman ,  FAULSTICH, Konrad

IPC: G01N21/64

CPC classification number: G01N21/645 ,  G01N21/255 ,  G01N21/8483 ,  G01N2201/0228 ,  G01N2201/024

Abstract: The invention provides for an optical measuring instrument and measuring device. The optical measuring instrument for investigating a specimen contained in a sample comprises at least one source for providing at least one electromagnetic beam intended to irradiate the sample and to interact with the specimen within the sample, at least one sensor for detecting an output of the interaction between the specimen and the electromagnetic beam, an integrally formed mechanical bench for the optical and electronic components, a sample holder for holding the sample, wherein the at least one source, the at least one sensor, and the mechanical bench are integrated in one monolithic optoelectronic module and the sample holder can be connected to this module.