公开(公告)号：FR2710162A1

公开(公告)日：1995-03-24

申请号：FR9311136

申请日：1993-09-17

Applicant: ESSILOR INT

Inventor： GILLES LE SAUX ,  PATRICK BERTRAND ,  XAVIER LIPPENS ,  CHRISTOPHE LAFAY

IPC: G01M11/02 ,  G02B27/46 ,  G01B11/24

Abstract: The invention relates to a method for the absolute measurement of the geometrical or optical structure of an optical component (4), comprising the steps consisting in: - illuminating the said optical component with incident light, the wavefront of which is known; - measuring, in a given plane, the charts of the slopes of the wavefront of the said light after reflection off the said optical component or transmission through the said optical component; which method furthermore includes at least one calculation procedure consisting in deducing, from the said measurement of the charts of slopes, the geometrical or optical structure of the optical component. The subject of the invention is also a device for the implementation of this method. The invention applies in particular in the ophthalmic field for checking or measuring ophthalmic lenses or moulds for manufacturing ophthalmic lenses.