公开(公告)号：JPH07190885A

公开(公告)日：1995-07-28

申请号：JP22043894

申请日：1994-09-14

Applicant: ESSILOR INT

Inventor： RUSO JIRU ,  BERUTORAN PATORITSUKU ,  RITSUPAN GUZABIE ,  RAFUE KURISUTOFU

IPC: G01B11/24 ,  G01B11/255 ,  G01M11/00 ,  G01M11/02

Abstract: PURPOSE: To absolutely measure the geometric or optical structure of an optical element with high accuracy, without any need of known knowledge by irradiating the optical element with incident light having a known wave front, and receiving the reflected light or transmitted light thereof with a plane having a map assigned regarding the wave front slope of the light. CONSTITUTION: When the shape, position and refraction factor of the surface 5 of a progressive lens 4 is known, for example, the characteristic value of the surface 6 (polished surface) of the lens 4 is measured as an absolute value. In this case, a light source means 1 irradiates light having a known wave front shape to the lens 4, and light transmitted through the lens 4 is received with a measurement means 2. A calculation means 3 is connected to the measurement means 2, and both thereof are combined, thereby quantifying a map for giving the surface shape of light incident on a measurement surface 6 as well as the wave front gradient of the light after transmission through the surface 6. Thereafter, the absolute characteristic value of the polished surface 6 is obtained from the slopes (wave front gradients).