公开(公告)号：US11156819B2

公开(公告)日：2021-10-26

申请号：US16290238

申请日：2019-03-01

Applicant: Femtonics Kft.

Inventor： Balazs Rozsa ,  Gergely Katona ,  Pal Maak ,  Mate Veress ,  Andras Feher ,  Gergely Szalay ,  Peter Matyas

IPC: G02B21/00 ,  G06K9/32 ,  G02F1/33

Abstract: A method for scanning along a substantially straight line (3D line) lying at an arbitrary direction in a 3D space with a given speed uses a 3D laser scanning microscope having a first pair of acousto-optic deflectors deflecting a laser beam in the x-z plane (x axis deflectors) and a second pair of acousto-optic deflectors deflecting the laser beam in the y-z plane (y axis deflectors) for focusing the laser beam in 3D. Further, a method for scanning a region of interest uses a 3D laser scanning microscope having acousto-optic deflectors for focusing a laser beam within a 3D space defined by an optical axis (Z) of the microscope and X, Y axes that are perpendicular to the optical axis and to each other.