-
公开(公告)号：WO2018057338A1
公开(公告)日：2018-03-29
申请号：PCT/US2017/051096
申请日：2017-09-12
Applicant: GENERAL ELECTRIC COMPANY
Inventor： JIN, Yannan , FU, Geng , EDIC, Peter M. , GAO, Hewei
Abstract: There is set forth herein a method including performing with an X-ray detector array of a CT imaging system one or more calibration scans, wherein the one or more calibration scans include obtaining for each element of the first through Nth elements of the X-ray detector array one or more calibration measurements; and updating a spectral response model for each element of the first through Nth elements using the one or more calibration measurements. In another aspect, a CT imaging system can perform imaging, e.g. including material decomposition (MD) imaging, using updated spectral response models for elements of an X-ray detector array. The spectral response models can be updated using a calibration process so that different elements of an X-ray detector array have different spectral response models.
Abstract translation: 这里阐述了一种方法，包括利用CT成像系统的X射线探测器阵列执行一个或多个校准扫描，其中所述一个或多个校准扫描包括针对第一个 通过X射线探测器阵列的第N个元素进行一次或多次校准测量; 以及使用所述一个或多个校准测量来更新所述第一元素至第N元素的每个元素的光谱响应模型。 在另一方面，CT成像系统可以执行成像，例如， 包括材料分解（MD）成像，使用更新的光谱响应模型用于X射线探测器阵列的元素。 光谱响应模型可以使用校准过程进行更新，以便X射线探测器阵列的不同元素具有不同的光谱响应模型。
-
公开(公告)号：EP3515309A1
公开(公告)日：2019-07-31
申请号：EP17768655.7
申请日：2017-09-12
Applicant: General Electric Company
Inventor： JIN, Yannan , FU, Geng , EDIC, Peter M. , GAO, Hewei
-
Search Results
2
records
(took 0.02 seconds)
