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1.发明申请
公开(公告)号：WO2019190957A1
公开(公告)日：2019-10-03
申请号：PCT/US2019/023824
申请日：2019-03-25
Applicant: GENERAL ELECTRIC COMPANY
IPC: B22F3/105 , B33Y30/00 , B33Y50/02 , G01N23/203 , G01N23/2252
Abstract: An additive manufacturing system includes a cabinet, an electron beam system, at least one imaging device, and a computing device. The cabinet is configured to enclose a component and defines a pinhole extending therethrough. The electron beam system is configured to generate an electron beam directed toward the component. Interactions between the component and the electron beam generate x-ray radiation. The at least one imaging device is configured to detect the x-ray radiation through the pinhole. The computing device is configured to image the component based on the x-ray radiation detected by the at least one imaging device.
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公开(公告)号：WO2018005940A1
公开(公告)日：2018-01-04
申请号：PCT/US2017/040232
申请日：2017-06-30
Applicant: GENERAL ELECTRIC COMPANY
Inventor： DOLINSKY, Sergei, Ivanovich , YANOFF, Brian, David , GUIDA, Renato , IVAN, Adrian
IPC: G01T1/20
CPC classification number: G01T1/202 , G01N2223/053 , G01N2223/41 , G01N2223/505 , G01N2223/628 , G01N2223/646 , G01T1/1644 , G01T1/1648 , G01T1/2002 , G01T1/2018
Abstract: A pixelated gamma detector includes a scintillator column assembly (140) having scintillator crystals (120) and optical transparent elements (125) alternating along a longitudinal axis, a collimator assembly (110) having longitudinal walls separated by collimator septum (114), the collimator septum (114) spaced apart to form collimator channels (118), the scintillator column assembly (140) positioned adjacent to the collimator assembly (110) so that the respective ones of the scintillator crystal (120) are positioned adjacent to respective ones of the collimator channels (118), the respective ones of the optical transparent element (125) are positioned adjacent to respective ones of the collimator septum (114), and a first photosensor (150) and a second photosensor (155), the first and the second photosensor each connected to an opposing end of the scintillator column assembly (140). A system and a method for inspecting and/or detecting defects in an interior of an object are also disclosed.
Abstract translation: 一种像素化伽玛检测器包括具有沿着纵轴交替的闪烁体晶体（120）和光学透明元件（125）的闪烁体柱组件（140），准直器组件（110），所述准直器组件具有由 准直器隔膜114，准直器隔膜114间隔开以形成准直器通道118，所述闪烁器柱组件140邻近所述准直器组件110定位，使得所述闪烁体晶体120中的相应闪烁体晶体被布置在所述准直器隔膜114上， 定位在相应的准直器通道（118）附近，光学透明元件（125）中的相应光学透明元件定位成与准直器隔膜（114）中的相应一个相邻，并且第一光电传感器（150）和第二光电传感器 （155），所述第一和第二光电传感器均连接至所述闪烁体柱组件（140）的相对端。 还公开了用于检查和/或检测物体内部缺陷的系统和方法。
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公开(公告)号：EP3479146A1
公开(公告)日：2019-05-08
申请号：EP17740836.6
申请日：2017-06-30
Applicant: General Electric Company
Inventor： DOLINSKY, Sergei, Ivanovich , YANOFF, Brian, David , GUIDA, Renato , IVAN, Adrian
IPC: G01T1/20
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4.发明公开
公开(公告)号：EP3774126A1
公开(公告)日：2021-02-17
申请号：EP19715354.7
申请日：2019-03-25
Applicant: General Electric Company
IPC: B22F3/105 , B33Y30/00 , B33Y50/02 , G01N23/203 , G01N23/2252
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