Removal Of Particulates From Gas Sampling Stream
    2.
    发明公开
    Removal Of Particulates From Gas Sampling Stream 有权
    on。。。。。。。。。。。。

    公开(公告)号:EP2224223A1

    公开(公告)日:2010-09-01

    申请号:EP10152743.0

    申请日:2010-02-05

    CPC classification number: G01N1/2202 G01N1/2258

    Abstract: A sample probe includes a sample probe tip filter (50, 70) and a deflector (54, 74) disposed in relation to the sample probe tip filter (50, 70), where the deflector (54, 74) is operable to deflect particles in a gas stream (14) away from the sample probe tip filter (50, 70).

    Abstract translation: 样品探针包括相对于样品探针末端过滤器(50,70)设置的样品探针末端过滤器(50,70)和偏转器(54,74),其中偏转器(54,74)可操作以偏转颗粒 在远离样品探针末端过滤器(50,70)的气流(14)中。

    System and method for decreasing a rate of slag formation at predetermined locations in a boiler system
    3.
    发明公开
    System and method for decreasing a rate of slag formation at predetermined locations in a boiler system 有权
    系统和方法,用于减小在蒸汽发生器系统的炉渣在特定位置形成

    公开(公告)号:EP1854868A1

    公开(公告)日:2007-11-14

    申请号:EP06124971.0

    申请日:2006-11-29

    Abstract: A system and a method for decreasing a rate of slag formation at predetermined locations in a boiler system (12) are provided. The boiler system (12) has a plurality of burners (47, 48, 50, 52), a plurality of slag detection sensors (116, 118, 120 121), a plurality of temperature sensors (110, 112, 114, 115) and a plurality of CO sensors (94, 96, 98, 99) disposed therein. The system determines locations within the boiler system (12) that have relatively high slag thickness levels utilizing the plurality of slag detection sensors (116, 118, 120 121) and then adjusts A/F ratios or mass flows of burners affecting those locations, or adds slag reducing additives to the burners affecting those locations, to decrease a rate of slag formation at the locations, utilizing signals from the plurality of slag detection sensor, the plurality of temperature sensors (110, 112, 114, 115), and the plurality of CO sensors (94, 96, 98, 99).

    Abstract translation: 本发明提供一种系统和用于在在锅炉系统(12)的预定位置降低的渣形成速率的方法。 锅炉系统(12)具有燃烧器(47,48,50,52)的复数,渣检测传感器(116,118,120,121)的复数,温度传感器(110,112,114,115)的多元 和CO传感器(94,96,98,99)的多元设置于其中。 bestimmt锅炉系统内的位置的系统(12)thathave相对高炉渣厚度水平利用渣检测传感器(116,118,120,121)的多元然后bestimmt A / F比或燃烧器影响这些位置的质量流量,或 增加矿渣降低添加剂到燃烧器影响这些位置上,这些位置以减少渣形成率,从渣检测传感器,温度传感器(110,112,114,115)的多个的多个用信号,并且所述多个 CO传感器(94,96,98,99)。

    System, method, and article of manufacture for adjusting temperature levels at predetermined locations in a boiler system
    5.
    发明公开
    System, method, and article of manufacture for adjusting temperature levels at predetermined locations in a boiler system 有权
    系统和方法,在蒸汽发生器中调整在特定位置处的温度水平

    公开(公告)号:EP1855053A1

    公开(公告)日:2007-11-14

    申请号:EP06124970.2

    申请日:2006-11-29

    CPC classification number: F23N5/003 F22B35/00 F23N1/022 F23N5/022

    Abstract: A system, a method, and an article of manufacture for adjusting temperature levels in predetermined locations in a boiler system (12) are provided. The boiler system (12) has a plurality of burners and a plurality of temperature sensors (110, 112, 114, 115) and CO sensors (94, 96, 98, 99) disposed therein. The system determines locations within the boiler system (12) that have relatively high temperature levels utilizing the plurality of temperature sensors (110, 112, 114, 115) and then adjusts A/F ratios of burners affecting those locations to decrease the temperature levels at the locations while maintaining CO levels at or below a threshold level.

    Abstract translation: 本发明提供一种系统,方法,以及制造用于在锅炉系统(12)的预定位置调整温度水平的制品。 锅炉系统(12)具有燃烧器的多个部分并加以设置在其中的温度传感器(110,112,114,115)和CO传感器(94,96,98,99)的复数。 bestimmt锅炉系统内的位置的系统(12)thathave相对高的温度水平利用温度传感器(110,112,114,115)的多元性然后bestimmt燃烧器影响这些位置在以降低温度水平的A / F比 的位置,同时在或低于阈值电平维持CO水平。

    Systems and methods for multi-level optimizing control systems for boilers
    6.
    发明公开
    Systems and methods for multi-level optimizing control systems for boilers 审中-公开
    针对锅炉控制系统的多级优化的系统和方法

    公开(公告)号:EP1921280A3

    公开(公告)日:2013-11-06

    申请号:EP07103532.3

    申请日:2007-03-05

    CPC classification number: F01K13/02

    Abstract: Systems and methods for multi-level optimization of emission levels and efficiency for a boiler system that includes creating both boiler-level models (516) and burner-level models (524) and receiving a plurality of boiler-level system variables. The received system variables are used along with boiler system constraints to optimize boiler-level setpoints. Once the boiler-level setpoints have been optimized they are sent to the burner level (504) of a hierarchical control system (302), where they are used to optimize burner-level setpoints. Once the burner-level setpoints have been optimized they are sent to the burner control loops (530) of the plant control system (506) to be implemented.

    Probe for removal of particulates from gas sampling stream
    8.
    发明公开
    Probe for removal of particulates from gas sampling stream 有权
    Sonde zur Entfernung von Partikeln aus einem Gasprobenstrom

    公开(公告)号:EP2216638A2

    公开(公告)日:2010-08-11

    申请号:EP10152683.8

    申请日:2010-02-04

    CPC classification number: G01N1/2258

    Abstract: A sample probe includes a sample probe tip filter (50, 70). The sample probe also includes a shield (52, 72) disposed in relation to the sample probe tip filter (50, 70), the shield (52, 72) being operable to deflect particles in a gas sampling stream (14) away from the sample probe tip filter (50, 70). The shield (52, 72) has at least one opening (60, 62, 76) that allows the gas within the gas sampling stream (14) and certain ones of the particles in the gas sampling stream (14) both traveling in a substantially flow reversal direction (66) to a primary direction (18) of the gas sampling stream (14) to enter the shield (52, 72) and contact the sample probe tip filter (50, 70).

    Abstract translation: 样品探针包括样品探针末端过滤器(50,70)。 样品探针还包括相对于样品探针末端过滤器(50,70)设置的屏蔽件(52,72),所述屏蔽件(52,72)可操作以将气体取样流(14)中的颗粒偏离 样品探头末端过滤器(50,70)。 屏蔽件(52,72)具有至少一个开口(60,62,76),其允许气体取样流(14)内的气体和气体取样流(14)中的某些颗粒都基本上 流动反向方向(66)到气体采样流(14)的主要方向(18)进入屏蔽(52,72),并接触样品探针末端过滤器(50,70)。

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