公开(公告)号：US11733685B2

公开(公告)日：2023-08-22

申请号：US17038386

申请日：2020-09-30

Applicant: GIST(Gwangju Institute of Science and Technology)

Inventor： Sun Kyu Lee ,  Dae Gweon Koh ,  Han Ul Kim ,  Jin Hyuk Hong ,  Dinuka Ravimal Ranawaka Arachchige

IPC: G05B19/418 ,  G01N21/88 ,  G06T7/00

CPC classification number: G05B19/41875 ,  G01N21/8806 ,  G06T7/0008 ,  G06T2207/10052

Abstract: The present disclosure relates to a surface inspection method using a mold surface inspection device, and more specifically, to a surface inspection method using a mold surface inspection device including a setting part in which an inspection object is set, a light source part configured to irradiate the inspection object with irradiated light so that a reflective highlight is generated on a surface of the inspection object, an imaging part configured to image the surface of the inspection object so that a highlight region where a reflective highlight is generated is included, and an image processing part configured to process an image imaged in the imaging part to provide the image to a worker so that the worker determines whether defects are generated on the surface of the inspection object on the basis of the image.