RADIATION DETECTOR
    1.
    发明专利

    公开(公告)号:AU2003264526A1

    公开(公告)日:2004-04-08

    申请号:AU2003264526

    申请日:2003-09-19

    Abstract: A sound output portion 7, a power supply switch 4, and a power supply portion 3, which are provided at a detachable portion A of a manipulation grip 1 are configured to be detachable from a main body portion B of the manipulation grip 1. Accordingly, upon sterilization using a sterilizing gas such as an EOG, the sound output portion 7, the power supply switch 4, and the power supply portion 3 can be removed on a detachable portion A basis. This in turn allows for using a sterilizing gas such as EOG to sterilize the radiation detector except the sound output portion 7, the power supply switch 4, and the power supply portion 3, thereby preventing damage caused by a negative pressure in the sound output portion 7.

    RADIATION DETECTOR
    2.
    发明专利

    公开(公告)号:AU2003257629A1

    公开(公告)日:2004-03-11

    申请号:AU2003257629

    申请日:2003-08-20

    Abstract: A radiation detector has a main body (1), and a radiation detection probe (2) detachably attached to the distal end of the main body (1). The probe (2) includes a detection unit (3) accommodating a radiation detection element (7), a cap-shaped shield member (6) mounted to the detection unit (3) so as to cover the distal end of the detection unit (3), and a probe cover (4) accommodating the detection unit (3) and the shield member (6). A connector (10) onto which the probe (2) is adapted to be screwed is provided on the distal end of the main body (1). A collimator (6A) for collimating incident radiation is provided on the distal end of the shield member (6).

    RADIATION DETECTOR
    3.
    发明专利

    公开(公告)号:AU2003257628A1

    公开(公告)日:2004-03-11

    申请号:AU2003257628

    申请日:2003-08-20

    Abstract: When the distal end of a radiation detection probe (2) is directed toward a place to be measured, pointer light emitted by a light-emitting device (7) sequentially passes through a transmission window (5C) of a radiation detection element (5) and a projection window (3E) of a probe cover (3) to be emitted onto the place to be measured. This pointer light clearly indicates the place as a bright spot. The radiation from the place passes through the distal end of the probe cover (3) to be collimated by a radiation-introducing window (4A) of a side shield (4), and then enters the radiation detection element (5). The dose of the radiation is detected in this way.

    RADIATION DETECTOR
    4.
    发明专利

    公开(公告)号:AU2003242302A1

    公开(公告)日:2003-11-11

    申请号:AU2003242302

    申请日:2003-05-14

    Abstract: A radiation detector having a head and a main body. The head has a probe and a first articulation. The probe contains a radiation detection element, and is movable due to the first articulation. Separately from the first articulation, a second articulation is provided on the main body or the head or therebetween. Accordingly, the radiation detector can move in a different way that allowed for by the first articulation. Combining the motion by the first articulation with the motion by the second articulation increases flexibility of handling the radiation detector. Hence the radiation detector has improved ease of operation.

    FAILURE ANALYZER FOR SEMICONDUCTOR DEVICE
    10.
    发明专利

    公开(公告)号:JP2003232749A

    公开(公告)日:2003-08-22

    申请号:JP2002030036

    申请日:2002-02-06

    Abstract: PROBLEM TO BE SOLVED: To provide a failure analyzer by which a clear pattern image is acquired with satisfactory efficiency regarding a semiconductor device of various impurity concentrations. SOLUTION: The failure analyzer 1a for the semiconductor device incidentally illuminates the semiconductor device 7 from its rear side by using tunable light to capture a reflected light image. By using illumination light at different wavelengths, a contrast of the reflected light image is spectrally measured, and a wavelength at which the contrast of the reflected light image becomes maximum is found. The wavelength is selected automatically by a computer 4a. The computer 4a uses illumination light at the frequency so as to enable an imaging device 3a to capture the reflected light image, and it generates pattern image data by using imaging data. Since an optimum wavelength of the illumination light is decided on the basis of the contrast of the reflected light image, the clear pattern image can be acquired. COPYRIGHT: (C)2003,JPO

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