公开(公告)号：WO02090906A3

公开(公告)日：2003-04-17

申请号：PCT/US0214639

申请日：2002-05-09

Applicant: HOSPITAL FOR SPECIAL SURGERY

Inventor： CAMACHO NANCY P ,  BOSTROM MATHIAS P G ,  BERTHA STEVE L

IPC: A61B5/00 ,  G01N21/35 ,  G01N21/55

CPC classification number: G01N21/552 ,  A61B5/0059 ,  A61B5/4504 ,  G01N21/35 ,  G01N21/359 ,  G01N2021/559 ,  G01N2201/0846

Abstract: A method of evaluating the surface of a material that has a distinguishable infrared spectrum comprising (a) positioning an infrared fiber optic probe to be in contact with a surface of the sample or material at a region of interest for detecting attenuated total reflectance or within a sufficient distance from the surface of the region for detecting reflection, (b) detecting mid- or near-infrared radiation attenuated total reflectance or reflection off of the surface of the sample or the material, (c) analyzing the infrared radiation from step (b) for at least one of peak height, peak area, frequency and chemometric parameters, and (d) actuating the removal device when a signal from the infrared fiber optic probe is between pre-selected values for at least one of peak height, peak area, frequency and chemometric parameters for the sample of the material.

Abstract translation: 一种评估具有可区别的红外光谱的材料的表面的方法，包括（a）将红外光纤探针定位成与感兴趣区域的样品或材料的表面接触以检测衰减的全反射率，或者在 距离用于检测反射的区域的表面足够的距离，（b）检测中间或近红外辐射减弱了样品或材料表面的全反射或反射，（c）分析来自步骤（b）的红外辐射 ），用于峰高，峰面积，频率和化学计量参数中的至少一个，以及（d）当来自红外光纤探针的信号处于峰值高度，峰值面积之中的至少一个的预选值之间时，启动去除装置 ，样品的频率和化学计量参数。

公开(公告)号：GB2396408B

公开(公告)日：2005-06-29

申请号：GB0318142

申请日：2002-05-09

Applicant: HOSPITAL FOR SPECIAL SURGERY

Inventor： CAMACHO NANCY P ,  BOSTROM MATHIAS P G ,  BERTHA STEVE L

IPC: A61B5/00 ,  G01N21/35 ,  G01N21/55

Abstract: A method of evaluating the surface of a material that has a distinguishable infrared spectrum comprising (a) positioning an infrared fiber optic probe to be in contact with a surface of the sample or material at a region of interest for detecting attenuated total reflectance or within a sufficient distance from the surface of the region for detecting reflection, (b) detecting mid- or near-infrared radiation attenuated total reflectance or reflection off of the surface of the sample or the material, (c) analyzing the infrared radiation from step (b) for at least one of peak height, peak area, frequency and chemometric parameters, and (d) actuating the removal device when a signal from the infrared fiber optic probe is between pre-selected values for at least one of peak height, peak area, frequency and chemometric parameters for the sample of the material.

公开(公告)号：GB2396408A

公开(公告)日：2004-06-23

申请号：GB0318142

申请日：2002-05-09

Applicant: HOSPITAL FOR SPECIAL SURGERY

Inventor： CAMACHO NANCY P ,  BOSTROM MATHIAS P G ,  BERTHA STEVE L

IPC: A61B5/00 ,  G01N21/35 ,  G01N21/55

Abstract: A method of evaluating the surface of a material that has a distinguishable infrared spectrum comprising (a) positioning an infrared fiber optic probe to be in contact with a surface of the sample or material at a region of interest for detecting attenuated total reflectance or within a sufficient distance from the surface of the region for detecting reflection, (b) detecting mid-or near-infrared radiation attenuated total reflectance or reflection off of the surface of the sample or the material, (c) analyzing the infrared radiation from step (b) for at least one of peak height, peak area, frequency and chemometric parameters, and (d) actuating the removal device when a signal from the infrared fiber optic probe is between pre-selected values for at least one of peak height, peak area, frequency and chemometric parameters for the sample of the material.

公开(公告)号：AU2002256509A1

公开(公告)日：2002-11-18

申请号：AU2002256509

申请日：2002-05-09

Applicant: HOSPITAL FOR SPECIAL SURGERY

Inventor： BERTHA STEVE L ,  CAMACHO NANCY P ,  BOSTROM MATHIAS P G

IPC: A61B5/00 ,  G01N21/35 ,  G01N21/55

Abstract: A method of evaluating the surface of a material that has a distinguishable infrared spectrum comprising (a) positioning an infrared fiber optic probe to be in contact with a surface of the sample or material at a region of interest for detecting attenuated total reflectance or within a sufficient distance from the surface of the region for detecting reflection, (b) detecting mid- or near-infrared radiation attenuated total reflectance or reflection off of the surface of the sample or the material, (c) analyzing the infrared radiation from step (b) for at least one of peak height, peak area, frequency and chemometric parameters, and (d) actuating the removal device when a signal from the infrared fiber optic probe is between pre-selected values for at least one of peak height, peak area, frequency and chemometric parameters for the sample of the material.