中科微点-全球专利检索

  1. Login
  2. Sign Up

Search Results

3 records (took 0.024 seconds)

    System and process for analysing a sample
    3.
    发明公开
    System and process for analysing a sample 有权
    系统和Verfahren zur分析einer探头

    公开(公告)号：EP1947445A1

    公开(公告)日：2008-07-23

    申请号：EP07300736.1

    申请日：2007-01-19

    Applicant: Horiba Jobin Yvon S.A.S.

    Inventor： Amary, Pascal ,  Ramdane, Benferhat ,  Cattelan, Denis

    IPC: G01N21/21 ,  G01J3/28

    CPC classification number: G01N21/211 ,  G01J3/2823 ,  G01J4/04 ,  G01N2021/213

    Abstract: The present invention concerns a system and a process for analysing a sample (6) comprising an excitation section (1) and an analyse section (7), said excitation section (1) including a light source (2) emitting an incident measurement luminous beam (3), a polarisation state generator (PSG) (4), first optical means (5), and said analyse section (7) comprising a polarisation state analyser (PSA) (8), a detection system (10) and second optical means (9).
    According to the invention, the excitation section (1) comprises an illumination source (12) emitting an incident visualization luminous beam (22), superposition optical means (13) enabling to the incident visualization luminous beam (22) to be send onto the sample surface (21) through an optical path which is identical to the optical path of the incident measurement luminous beam (3) and the analyse section (7) comprises separation optical means (14) enabling to transmit a part of the reflected or transmitted visualization luminous beam (23) and a part of the reflected or transmitted measurement luminous beam towards a visualization direction (25).

    Abstract translation: 本发明涉及一种用于分析包括激励部分（1）和分析部分（7）的样品（6）的系统和方法，所述激励部分（1）包括发射入射测量光束的光源（2） （3），偏振状态发生器（PSG）（4），第一光学装置（5）和包括偏振状态分析器（PSA）（8）的所述分析部分（7），检测系统（10）和第二光学 （9）。 根据本发明，激励部分（1）包括发射入射的可视化发光束（22）的照明源（12），能够将入射的可视化发光束（22）发送到样品上的叠加光学装置（13） 通过与入射测量光束（3）和分析部分（7）的光路相同的光路的表面（21）包括分离光学装置（14），其能够透射部分反射或透射的可视光 光束（23）和反射或透射的测量发光束的一部分朝向可视化方向（25）。

Patent Agency Ranking