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1.发明授权Inflatable probe apparatus for uniformly contacting and testing microcircuits 失效用于均匀接触和测试微型计算机的可充电探头设备
公开(公告)号：US3493858A
公开(公告)日：1970-02-03
申请号：US3493858D
申请日：1966-01-14
Applicant: IBM
Inventor： BARON DAVID G , RUOFF CARL E
CPC classification number: H05K1/029 , G01R1/0735 , H05K1/147 , H05K3/365 , H05K2201/10212 , H05K2203/074 , Y10T29/49124
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公开(公告)号：CA893307A
公开(公告)日：1972-02-15
申请号：CA893307D
Applicant: IBM
Inventor： RUOFF CARL E , BARON DAVID G
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