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1.发明授权Method of testing an ordered,multi-element electrical circuit array including connecting certain elements in common 失效测试订购的多元电路阵列的方法，包括连接某些元素在公共
公开(公告)号：US3471778A
公开(公告)日：1969-10-07
申请号：US3471778D
申请日：1967-01-13
Applicant: IBM
Inventor： BENNETT JACK PLYMETTE , GORDON DAVID , KUTCHER MYRON MARTIN
IPC: G01R31/319 , G01R31/02 , G01R15/12
CPC classification number: G01R31/31917
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公开(公告)号：CA764079A
公开(公告)日：1967-07-25
申请号：CA764079D
Applicant: IBM
Inventor： ARNOLD JOHN A , GORDON DAVID , KUTCHER MYRON M
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