公开(公告)号：JP2004102260A

公开(公告)日：2004-04-02

申请号：JP2003288556

申请日：2003-08-07

Applicant: Internatl Business Mach Corp ,  インターナショナル・ビジネス・マシーンズ・コーポレーションInternational Business Maschines Corporation

Inventor： KODATE MANABU ,  IKEDA MASATO

IPC: G02F1/13 ,  G02F1/133 ,  G02F1/1368 ,  G09G3/20 ,  G09G3/36 ,  H01L51/50 ,  H05B33/14

Abstract: PROBLEM TO BE SOLVED: To provide a liquid cell and its inspection method for effectively inspecting the image quality of the liquid cell before a driver IC is connected. SOLUTION: This liquid cell has an inspection circuit 4 and 5. The inspection circuit has scanning signal wires 11 or inspection TFTs 22 connected to data signal wires 12, inspection terminals 31-35 connected to the scanning signal wires 11, and inspection terminals 41-53 connected to data signal wires 12. A plurality of inspection TFTs 22 are connected to the inspection terminals. A display region is divided into a plurality of blocks, and a set of scanning side inspection terminals and a set of data signal side inspection terminals are connected to every block. Scanning signal wires and data signal wires of a specific region are assigned to every block. Since a plurality of signal wires are suitably collected by the inspection TFTs and inspection terminals, necessary image quality inspection can be performed without using multi-pin probes. COPYRIGHT: (C)2004,JPO

公开(公告)号：JP2001265248A

公开(公告)日：2001-09-28

申请号：JP2000070203

申请日：2000-03-14

Applicant: IBM

Inventor： KODATE MANABU ,  IKEDA MASATO

IPC: G02F1/13 ,  G02F1/133 ,  G02F1/136 ,  G02F1/1368 ,  G09F9/00 ,  G09F9/30 ,  G09G3/36

Abstract: PROBLEM TO BE SOLVED: To provide a liquid crystal cell and an inspection method therefor for efficiently inspecting picture quality of the liquid crystal cell before a driver IC is connected therewith. SOLUTION: The liquid crystal cell 11 has circuits 4, 5 for inspection. The circuits for inspection comprise each scanning signal wiring 11 or TFTs 22 for inspection connected with each signal wiring 12, inspection terminals 31-35 to be connected with the scanning signal wiring 11, and inspection terminals 41-45 to be connected with the signal wiring 12. Each inspection terminal is connected with multiple inspection TFTs 22. A display area is split into multiple blocks, and each block is connected with a set of scanning side inspection terminals and a set of signal side inspection terminals. Scanning signal wiring and signal wiring for a specific area are allocated to each block. Since multiple signal lines are properly put together with the TFTs and terminals for inspection, necessary image quality inspection can be carried out without using a multi-pin probe.