公开(公告)号：PE13291A1

公开(公告)日：1991-04-11

申请号：PE17088390

申请日：1990-06-18

Applicant: IBM

Inventor： MC DONALD BRADLEY SCOTT ,  KOVACH ROBERT CHARLES

IPC: G01R31/00 ,  G06F11/00 ,  G01R31/02 ,  G06F11/22

Abstract: CARACTERIZADO POR EL HECHO DE COMPRENDER UNA CONVERTIDORA DE DIGITAL - A - ANALOGICO PROVISTA DE INGRESOS Y SALIDAS, Y MEDIOS CONECTORES DE CONMUTACION QUE RECIBEN MEDIOS DE TOMACORRIENTE. EL PRESENTE INVENTO SE RELACIONA CON SISTEMAS Y METODOS PARA VERIFICAR EQUIPOS ELECTRICOS, PROPORCIONANDO GRAN CAPACIDAD DE DIAGNOSTICO

公开(公告)号：DE69015714T2

公开(公告)日：1995-06-29

申请号：DE69015714

申请日：1990-06-07

Applicant: IBM

Inventor： KOVACH ROBERT CHARLES ,  MCDONALD BRADLEY SCOTT

IPC: G01R31/00 ,  G01R31/02 ,  G06F11/22 ,  G01R31/04

Abstract: A wrap test system automatically providing wrap interconnections for wrap diagnostic capability of electronic devices obviating the need for wrap cables. A connector system has a first state wherein DAC outputs are automatically internally routed to corresponding ADC inputs thereby closing a wrap loop whereupon automated DAC to ADC loop tests are performed. A second switching state is provided automatically by insertion of connector plugs into the connector system whereby the loop is broken and DAC outputs and ADC inputs are made available externally to respective output and input connectors.

公开(公告)号：DE69015714D1

公开(公告)日：1995-02-16

申请号：DE69015714

申请日：1990-06-07

Applicant: IBM

Inventor： KOVACH ROBERT CHARLES ,  MCDONALD BRADLEY SCOTT

IPC: G01R31/00 ,  G01R31/02 ,  G06F11/22 ,  G01R31/04

Abstract: A wrap test system automatically providing wrap interconnections for wrap diagnostic capability of electronic devices obviating the need for wrap cables. A connector system has a first state wherein DAC outputs are automatically internally routed to corresponding ADC inputs thereby closing a wrap loop whereupon automated DAC to ADC loop tests are performed. A second switching state is provided automatically by insertion of connector plugs into the connector system whereby the loop is broken and DAC outputs and ADC inputs are made available externally to respective output and input connectors.

公开(公告)号：BR9002866A

公开(公告)日：1991-08-20

申请号：BR9002866

申请日：1990-06-18

Applicant: IBM

Inventor： KOVACH ROBERT CHARLES ,  MCDONALD BRADLEY SCOTT

IPC: G01R31/00 ,  G01R31/02 ,  G06F11/22 ,  G06F11/00

Abstract: A wrap test system automatically providing wrap interconnections for wrap diagnostic capability of electronic devices obviating the need for wrap cables. A connector system has a first state wherein DAC outputs are automatically internally routed to corresponding ADC inputs thereby closing a wrap loop whereupon automated DAC to ADC loop tests are performed. A second switching state is provided automatically by insertion of connector plugs into the connector system whereby the loop is broken and DAC outputs and ADC inputs are made available externally to respective output and input connectors.