Abstract:
PROBLEM TO BE SOLVED: To provide an in-line measurement technology of switching delay history effects in an integrated circuit device. SOLUTION: A pulse is sent out to a delay chain. The pulse is in effect synchronized with the signal of a ring oscillator. The delay chain and the ring oscillator, in effect, include the same gate up to a defined point on the ring oscillator, corresponding to a remote edge of the delay chain. When the pulse reaches the remote edge of the delay chain, at least one difference is measured between the number of gates which the edge of the signal in the ring oscillator crosses and the number of gates which the edge of the corresponding pulse in the delay chain crosses. One or plural switching histories at the integrated circuit device are decided, in accordance with at least the one measured difference at the number of gates which the edge of the signal and the corresponding pulse edge crosses. COPYRIGHT: (C)2008,JPO&INPIT
Abstract:
A probabilistic digitizer for extracting information from a Josephson comparator is disclosed. The digitizer uses statistical methods to aggregate over a set of comparator readouts, effectively increasing the sensitivity of the comparator even when an input signal falls within the comparator's gray zone. Among other uses, such a digitizer may be used to discriminate between states of a qubit.
Abstract:
A probabilistic digitizer for extracting information from a Josephson comparator is disclosed. The digitizer uses statistical methods to aggregate over a set of comparator readouts, effectively increasing the sensitivity of the comparator even when an input signal falls within the comparator's gray zone. Among other uses, such a digitizer may be used to discriminate between states of a qubit.