公开(公告)号：DE2408010A1

公开(公告)日：1974-10-24

申请号：DE2408010

申请日：1974-02-20

Applicant: IBM

Inventor： MUELLER KARL ALEX ,  SMITH WILLIAM V ,  POHL DIETER W ,  BADERTSCHER RENE

IPC: G11C11/42 ,  G02B27/00 ,  G11B7/00 ,  G11B7/0055 ,  G11B7/013 ,  G11B7/12 ,  G11B7/24085 ,  G11B7/243 ,  G11B7/2433 ,  G11B7/30 ,  G11B17/00 ,  G11C13/04 ,  G11B7/24

公开(公告)号：CA1243231A

公开(公告)日：1988-10-18

申请号：CA441049

申请日：1983-11-14

Applicant: IBM

Inventor： POHL DIETER W

IPC: G02B21/00 ,  G01N37/00 ,  G01Q20/00 ,  G01Q60/22 ,  G02B6/04 ,  G02B6/26 ,  G02B21/06 ,  G02B21/36

Abstract: OPTICAL NEAR-FIELD SCANNING MICROSCOPE The optical near-field scanning microscope comprises an "objective" (7) attached to the conventional vertical adjustment appliance (6) and consisting of an optically transparent crystal having a metal coating with an aperture at its tip with a diameter of less than one wavelength of the light used for illuminating the object (4). Connected to the aperture-far end of the "objective" (7) is a photodetector (11) via an optical filter (9) and an optical fiber glass cable (10). Scanning the object (4) is done by appropriately moving the support (3) along x/y-coordinates. The resolution obtainable with this microscope is about 10 times that of state-of-the-art microscopes.

公开(公告)号：DE3279432D1

公开(公告)日：1989-03-09

申请号：DE3279432

申请日：1982-11-23

Applicant: IBM

Inventor： CHAPPELL TERRY IVAN ,  POHL DIETER W ,  WOODALL JERRY MCPHERSON

IPC: H01L31/12 ,  H01L31/173 ,  H01L31/16

Abstract: In a first region (2) of a monolithic direct bandgap semiconductor device, an electrical input signal is converted to photons which serve as carriers of the signal through a semi-insulating substrate (8). The photons are reconverted to an electrical output signal in a second region (10) of the device. At least one (10) of the signal conversion regions has a multi-PN-junction structure with the PN junctions disposed obliquely to the photon path through the device. Alternatively, the second region may perform the electrical signal-to-photon signal conversion and the first region the photon signal-to-electrical signal conversion. … Applications of the device are for the conversion of AC to DC signals, AC to AC signals and DC to DC signals. The device can also serve as an electron accelerator capable of providing a field of 2000 volts per centimeter.