公开(公告)号：FR2357010A1

公开(公告)日：1978-01-27

申请号：FR7716789

申请日：1977-05-25

Applicant: IBM

Inventor： BAXTER DUANE W ,  SHIPWAY RICHARD E

IPC: G01B11/24 ,  G01N21/88 ,  G01N21/93 ,  G01N21/956 ,  G01R31/308 ,  G06T1/00 ,  H05B39/08 ,  G06K11/00

Abstract: Successive areas of a high-resolution object image are compared with corresponding areas of a low-resolution master pattern to produce signals representing the quality of the object. Comparison is effected by detecting which of a set of features occurs in each area of the object image, detecting which feature of the same set occurs in a larger area of the master pattern, and determining whether these two features are the same.